Computer Engineering Publications Database (2000-2018) DfT Schemes for Resistive Open Defects in RRAMs 
| Publication Type | Conference Paper |
|---|---|
| Title | DfT Schemes for Resistive Open Defects in RRAMs |
| Author(s) | N.Z.B. Haron S. Hamdioui |
| Publication Date | March 2012 |
| Conference Name | Design, Automation & Test in Europe Conference & Exhibition |
| Period | 12-16 March 2012 |
| Location | Dresden, Germany |
| ISBN | t.b.s. |
| Page Numbers | |
| published | Published |
| Selected Publication | Yes |
| Note | |
| Topic(s) | None |
| Theme(s) | None |
| Project(s) | None |
| Group(s) | Computer Engineering |
IEEE BibTex entry:
@inproceedings{,
author = "N.Z.B. Haron and S. Hamdioui",
title = "DfT Schemes for Resistive Open Defects in RRAMs",
booktitle = "Proc. Design, Automation & Test in Europe Conference & Exhibition",
address = "Dresden, Germany",
month = "March",
year = "2012",
pages = ""
}
author = "N.Z.B. Haron and S. Hamdioui",
title = "DfT Schemes for Resistive Open Defects in RRAMs",
booktitle = "Proc. Design, Automation & Test in Europe Conference & Exhibition",
address = "Dresden, Germany",
month = "March",
year = "2012",
pages = ""
}