Computer Engineering Publications Database (2000-2018) Variation tolerant on-chip degradation sensors for dynamic reliability management systems 
| Publication Type | Journal Paper |
|---|---|
| Title | Variation tolerant on-chip degradation sensors for dynamic reliability management systems |
| Author(s) | Y. Wang M. Enachescu S.D. Cotofana L. Fang |
| Publication Date | September 2012 |
| Journal Name | Microelectronics Reliability |
| Volume | 52 |
| Issue | 9-10 |
| Page Numbers | 1787-1791 |
| ISSN | 0026-2714 |
| published | Published |
| Selected Publication | No |
| Note | |
| Topic(s) | Reliability |
| Theme(s) | None |
| Project(s) | None |
| Group(s) | Computer Engineering |
IEEE BibTex entry:
@article{,
author = "Y. Wang and M. Enachescu and S.D. Cotofana and L. Fang",
title = "Variation tolerant on-chip degradation sensors for dynamic reliability management systems",
journal = "Microelectronics Reliability",
volume = "52",
issue = "9-10",
month = "September",
year = "2012",
pages = "1787-1791"
}
author = "Y. Wang and M. Enachescu and S.D. Cotofana and L. Fang",
title = "Variation tolerant on-chip degradation sensors for dynamic reliability management systems",
journal = "Microelectronics Reliability",
volume = "52",
issue = "9-10",
month = "September",
year = "2012",
pages = "1787-1791"
}