Computer Engineering Publications Database (2000-2018) Exploring Test Opportunities for Memory and Interconnects in 3D ICs 
| Publication Type | Conference Paper |
|---|---|
| Title | Exploring Test Opportunities for Memory and Interconnects in 3D ICs |
| Author(s) | M. Taouil M. Lefter S. Hamdioui |
| Publication Date | December 2012 |
| Conference Name | International Design & Test Symposium |
| Period | 15-17 December 2012 |
| Location | Doha, Qatar |
| ISBN | unknown |
| Page Numbers | |
| published | Published |
| Selected Publication | No |
| Note | |
| Topic(s) | 3D Stacking |
| Theme(s) | Dependable Nano Computing |
| Project(s) | 3DIM3 |
| Group(s) | Computer Engineering |
IEEE BibTex entry:
@inproceedings{,
author = "M. Taouil and M. Lefter and S. Hamdioui",
title = "Exploring Test Opportunities for Memory and Interconnects in 3D ICs",
booktitle = "Proc. International Design & Test Symposium",
address = "Doha, Qatar",
month = "December",
year = "2012",
pages = ""
}
author = "M. Taouil and M. Lefter and S. Hamdioui",
title = "Exploring Test Opportunities for Memory and Interconnects in 3D ICs",
booktitle = "Proc. International Design & Test Symposium",
address = "Doha, Qatar",
month = "December",
year = "2012",
pages = ""
}