BTI Impacts on Logical Gates in Nano-scale CMOS Technology 134_bti_impacts_on_logical_gates_in_nanoscale_cmos_technology.pdf

Publication TypeConference Paper
TitleBTI Impacts on Logical Gates in Nano-scale CMOS Technology
Author(s)M.S. Khan
S. Hamdioui
H. Kukner
F. Catthoor
P. Raghavan
Publication DateApril 2012
Conference Name15th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems
Period18-20 April 2012
LocationTallinn, Estonia
ISBNt.b.s.
Page Numbers
publishedPublished
Selected PublicationNo
Note
Topic(s)None
Theme(s)None
Project(s)None
Group(s)Computer Engineering

IEEE BibTex entry:
@inproceedings{,
author = "M.S. Khan and S. Hamdioui and H. Kukner and F. Catthoor and P. Raghavan",
title = "BTI Impacts on Logical Gates in Nano-scale CMOS Technology",
booktitle = "Proc. 15th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems",
address = "Tallinn, Estonia",
month = "April",
year = "2012",
pages = ""
}