BTI Impacts on Logical Gates in Nano-scale CMOS Technology
Publication Type | Conference Paper |
---|---|
Title | BTI Impacts on Logical Gates in Nano-scale CMOS Technology |
Author(s) | M.S. Khan S. Hamdioui H. Kukner F. Catthoor P. Raghavan |
Publication Date | April 2012 |
Conference Name | 15th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems |
Period | 18-20 April 2012 |
Location | Tallinn, Estonia |
ISBN | t.b.s. |
Page Numbers | |
published | Published |
Selected Publication | No |
Note | |
Topic(s) | None |
Theme(s) | None |
Project(s) | None |
Group(s) | Computer Engineering |
IEEE BibTex entry:
@inproceedings{,
author = "M.S. Khan and S. Hamdioui and H. Kukner and F. Catthoor and P. Raghavan",
title = "BTI Impacts on Logical Gates in Nano-scale CMOS Technology",
booktitle = "Proc. 15th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems",
address = "Tallinn, Estonia",
month = "April",
year = "2012",
pages = ""
}
author = "M.S. Khan and S. Hamdioui and H. Kukner and F. Catthoor and P. Raghavan",
title = "BTI Impacts on Logical Gates in Nano-scale CMOS Technology",
booktitle = "Proc. 15th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems",
address = "Tallinn, Estonia",
month = "April",
year = "2012",
pages = ""
}