Computer Engineering Publications Database (2000-2018) A Nonlinear Degradation Path Dependent End-of-Life Estimation Framework from Noisy Observations 
| Publication Type | Journal Paper |
|---|---|
| Title | A Nonlinear Degradation Path Dependent End-of-Life Estimation Framework from Noisy Observations |
| Author(s) | N. Cucu Laurenciu S.D. Cotofana |
| Publication Date | September 2013 |
| Journal Name | Microelectronics Reliability |
| Volume | 53 |
| Issue | 9-11 |
| Page Numbers | 1213–1217 |
| ISSN | 0026-2714 |
| published | Published |
| Selected Publication | No |
| Note | |
| Topic(s) | Reliability |
| Theme(s) | Dependable Nano Computing |
| Project(s) | None |
| Group(s) | Computer Engineering |
IEEE BibTex entry:
@article{,
author = "N. Cucu Laurenciu and S.D. Cotofana",
title = "A Nonlinear Degradation Path Dependent End-of-Life Estimation Framework from Noisy Observations ",
journal = "Microelectronics Reliability",
volume = "53",
issue = "9-11",
month = "September",
year = "2013",
pages = "1213–1217"
}
author = "N. Cucu Laurenciu and S.D. Cotofana",
title = "A Nonlinear Degradation Path Dependent End-of-Life Estimation Framework from Noisy Observations ",
journal = "Microelectronics Reliability",
volume = "53",
issue = "9-11",
month = "September",
year = "2013",
pages = "1213–1217"
}