Computer Engineering Publications Database (2000-2018) Comparison of Reaction-Diffusion and Atomistic Trap-Based BTI Models for Logic Gates 
| Publication Type | Journal Paper |
|---|---|
| Title | Comparison of Reaction-Diffusion and Atomistic Trap-Based BTI Models for Logic Gates |
| Author(s) | H. Kukner M.S. Khan S. Hamdioui P. Raghavan F. Catthoor |
| Publication Date | March 2014 |
| Journal Name | IEEE Transactions on Reliability |
| Volume | 14 |
| Issue | 1 |
| Page Numbers | 182-193 |
| ISSN | 0018-9529 |
| published | Published |
| Selected Publication | Yes |
| Note | |
| Topic(s) | None |
| Theme(s) | Dependable Nano Computing |
| Project(s) | None |
| Group(s) | Computer Engineering |
IEEE BibTex entry:
@article{,
author = "H. Kukner and M.S. Khan and S. Hamdioui and P. Raghavan and F. Catthoor",
title = "Comparison of Reaction-Diffusion and Atomistic Trap-Based BTI Models for Logic Gates",
journal = "IEEE Transactions on Reliability",
volume = "14",
issue = "1",
month = "March",
year = "2014",
pages = "182-193"
}
author = "H. Kukner and M.S. Khan and S. Hamdioui and P. Raghavan and F. Catthoor",
title = "Comparison of Reaction-Diffusion and Atomistic Trap-Based BTI Models for Logic Gates",
journal = "IEEE Transactions on Reliability",
volume = "14",
issue = "1",
month = "March",
year = "2014",
pages = "182-193"
}