Computer Engineering Publications Database (2000-2018) Testing Open Defects in Memristor-Based Memories 
| Publication Type | Journal Paper |
|---|---|
| Title | Testing Open Defects in Memristor-Based Memories |
| Author(s) | S. Hamdioui M. Taouil N.Z.B. Haron |
| Publication Date | January 2015 |
| Journal Name | IEEE Transactions on Computers |
| Volume | 64 |
| Issue | 1 |
| Page Numbers | 247-259 |
| ISSN | 0018-9340 |
| published | Published |
| Selected Publication | Yes |
| Note | |
| Topic(s) | Memristor Nano Devices |
| Theme(s) | Dependable Nano Computing |
| Project(s) | None |
| Group(s) | Computer Engineering |
IEEE BibTex entry:
@article{,
author = "S. Hamdioui and M. Taouil and N.Z.B. Haron",
title = "Testing Open Defects in Memristor-Based Memories",
journal = "IEEE Transactions on Computers",
volume = "64",
issue = "1",
month = "January",
year = "2015",
pages = "247-259"
}
author = "S. Hamdioui and M. Taouil and N.Z.B. Haron",
title = "Testing Open Defects in Memristor-Based Memories",
journal = "IEEE Transactions on Computers",
volume = "64",
issue = "1",
month = "January",
year = "2015",
pages = "247-259"
}