Computer Engineering Publications Database (2000-2018) Testing Methods for PUF-Based Secure Key Storage Circuits 
| Publication Type | Journal Paper |
|---|---|
| Title | Testing Methods for PUF-Based Secure Key Storage Circuits |
| Author(s) | A.M.M.O. Cortez G. Roelofs S. Hamdioui G. Di Natale |
| Publication Date | October 2014 |
| Journal Name | Journal of Electronic Testing: Theory and Applications |
| Volume | 30 |
| Issue | 5 |
| Page Numbers | 581-594 |
| ISSN | 0923-8174 |
| published | Published |
| Selected Publication | No |
| Note | Digital Object Identifier (DOI): 10.1007/s10836-014-5471-7 |
| Topic(s) | None |
| Theme(s) | None |
| Project(s) | None |
| Group(s) | Computer Engineering |
IEEE BibTex entry:
@article{,
author = "A.M.M.O. Cortez and G. Roelofs and S. Hamdioui and G. Di Natale",
title = "Testing Methods for PUF-Based Secure Key Storage Circuits",
journal = "Journal of Electronic Testing: Theory and Applications",
volume = "30",
issue = "5",
month = "October",
year = "2014",
pages = " 581-594"
}
author = "A.M.M.O. Cortez and G. Roelofs and S. Hamdioui and G. Di Natale",
title = "Testing Methods for PUF-Based Secure Key Storage Circuits",
journal = "Journal of Electronic Testing: Theory and Applications",
volume = "30",
issue = "5",
month = "October",
year = "2014",
pages = " 581-594"
}