Comparative Analysis of R-D and Atomistic Trap-Based BTI models on SRAM Sense Amplifier
Publication Type | Conference Proceedings |
---|---|
Title | Comparative Analysis of R-D and Atomistic Trap-Based BTI models on SRAM Sense Amplifier |
Author(s) | I.O. Agbo M. Taouil S. Hamdioui S. Cosemans P Weckx P. Raghavan F. Catthoor |
Publication Date | April 2015 |
Conference Name | Design and Technology of Integrated Systems in the Nanoscale Era |
Period | 21-23 April 2015 |
Location | Naples, Italy |
ISBN | 978-1-4799-1999-4 |
Editor(s) | |
published | Published |
Selected Publication | No |
Note | Best Paper Award |
Topic(s) | None |
Theme(s) | None |
Project(s) | None |
Group(s) | Computer Engineering |
IEEE BibTex entry:
@proceedings{,
author = "I.O. Agbo and M. Taouil and S. Hamdioui and S. Cosemans and P Weckx and P. Raghavan and F. Catthoor",
title = "Comparative Analysis of R-D and Atomistic Trap-Based BTI models on SRAM Sense Amplifier",
conference = "Design and Technology of Integrated Systems in the Nanoscale Era",
address = "Naples, Italy",
month = "April",
year = "2015",
editors = ""
}
author = "I.O. Agbo and M. Taouil and S. Hamdioui and S. Cosemans and P Weckx and P. Raghavan and F. Catthoor",
title = "Comparative Analysis of R-D and Atomistic Trap-Based BTI models on SRAM Sense Amplifier",
conference = "Design and Technology of Integrated Systems in the Nanoscale Era",
address = "Naples, Italy",
month = "April",
year = "2015",
editors = ""
}