Comparative Analysis of R-D and Atomistic Trap-Based BTI models on SRAM Sense Amplifier 1482_comparative_analysis_of_rd_and_atomistic_trapbased_bti_mo.pdf

Publication TypeConference Proceedings
TitleComparative Analysis of R-D and Atomistic Trap-Based BTI models on SRAM Sense Amplifier
Author(s)I.O. Agbo
M. Taouil
S. Hamdioui
S. Cosemans
P Weckx
P. Raghavan
F. Catthoor
Publication DateApril 2015
Conference NameDesign and Technology of Integrated Systems in the Nanoscale Era
Period21-23 April 2015
LocationNaples, Italy
ISBN978-1-4799-1999-4
Editor(s)
publishedPublished
Selected PublicationNo
NoteBest Paper Award
Topic(s)None
Theme(s)None
Project(s)None
Group(s)Computer Engineering

IEEE BibTex entry:
@proceedings{,
author = "I.O. Agbo and M. Taouil and S. Hamdioui and S. Cosemans and P Weckx and P. Raghavan and F. Catthoor",
title = "Comparative Analysis of R-D and Atomistic Trap-Based BTI models on SRAM Sense Amplifier",
conference = "Design and Technology of Integrated Systems in the Nanoscale Era",
address = "Naples, Italy",
month = "April",
year = "2015",
editors = ""
}