Computer Engineering Publications Database (2000-2018) Integral Impact of BTI and Voltage Temperature Variation on SRAM Sense Amplifier 
| Publication Type | Conference Proceedings |
|---|---|
| Title | Integral Impact of BTI and Voltage Temperature Variation on SRAM Sense Amplifier |
| Author(s) | I.O. Agbo M. Taouil S. Hamdioui H. Kukner P Weckx P. Raghavan F. Catthoor |
| Publication Date | April 2015 |
| Conference Name | IEEE VLSI Test Symposium |
| Period | 27-29 April 2015 |
| Location | Napa, USA |
| ISBN | 978-1-4799-7597-6 |
| Editor(s) | |
| published | Published |
| Selected Publication | No |
| Note | |
| Topic(s) | None |
| Theme(s) | None |
| Project(s) | None |
| Group(s) | Computer Engineering |
IEEE BibTex entry:
@proceedings{,
author = "I.O. Agbo and M. Taouil and S. Hamdioui and H. Kukner and P Weckx and P. Raghavan and F. Catthoor",
title = "Integral Impact of BTI and Voltage Temperature Variation on SRAM Sense Amplifier",
conference = "IEEE VLSI Test Symposium",
address = "Napa, USA",
month = "April",
year = "2015",
editors = ""
}
author = "I.O. Agbo and M. Taouil and S. Hamdioui and H. Kukner and P Weckx and P. Raghavan and F. Catthoor",
title = "Integral Impact of BTI and Voltage Temperature Variation on SRAM Sense Amplifier",
conference = "IEEE VLSI Test Symposium",
address = "Napa, USA",
month = "April",
year = "2015",
editors = ""
}