Read Path Degradation Analysis in SRAM 1540_read_path_degradation_analysis_in_sram.pdf

Publication TypeConference Proceedings
TitleRead Path Degradation Analysis in SRAM
Author(s)I.O. Agbo
M. Taouil
S. Hamdioui
P Weckx
S. Cosemans
F. Catthoor
W Dehaene
Publication DateMay 2016
Conference NameIEEE European Test Symposium
Period24-27 May 2016
LocationAmsterdam, The Netherlands
ISBNxxxxx
Editor(s)
publishedPublished
Selected PublicationNo
Note
Topic(s)None
Theme(s)None
Project(s)None
Group(s)Computer Engineering

IEEE BibTex entry:
@proceedings{,
author = "I.O. Agbo and M. Taouil and S. Hamdioui and P Weckx and S. Cosemans and F. Catthoor and W Dehaene",
title = "Read Path Degradation Analysis in SRAM",
conference = "IEEE European Test Symposium",
address = "Amsterdam, The Netherlands",
month = "May",
year = "2016",
editors = ""
}