Computer Engineering Publications Database (2000-2018) Read Path Degradation Analysis in SRAM 
| Publication Type | Conference Proceedings |
|---|---|
| Title | Read Path Degradation Analysis in SRAM |
| Author(s) | I.O. Agbo M. Taouil S. Hamdioui P Weckx S. Cosemans F. Catthoor W Dehaene |
| Publication Date | May 2016 |
| Conference Name | IEEE European Test Symposium |
| Period | 24-27 May 2016 |
| Location | Amsterdam, The Netherlands |
| ISBN | xxxxx |
| Editor(s) | |
| published | Published |
| Selected Publication | No |
| Note | |
| Topic(s) | None |
| Theme(s) | None |
| Project(s) | None |
| Group(s) | Computer Engineering |
IEEE BibTex entry:
@proceedings{,
author = "I.O. Agbo and M. Taouil and S. Hamdioui and P Weckx and S. Cosemans and F. Catthoor and W Dehaene",
title = "Read Path Degradation Analysis in SRAM",
conference = "IEEE European Test Symposium",
address = "Amsterdam, The Netherlands",
month = "May",
year = "2016",
editors = ""
}
author = "I.O. Agbo and M. Taouil and S. Hamdioui and P Weckx and S. Cosemans and F. Catthoor and W Dehaene",
title = "Read Path Degradation Analysis in SRAM",
conference = "IEEE European Test Symposium",
address = "Amsterdam, The Netherlands",
month = "May",
year = "2016",
editors = ""
}