Read Path Degradation Analysis in SRAM
Publication Type | Conference Proceedings |
---|---|
Title | Read Path Degradation Analysis in SRAM |
Author(s) | I.O. Agbo M. Taouil S. Hamdioui P Weckx S. Cosemans F. Catthoor W Dehaene |
Publication Date | May 2016 |
Conference Name | IEEE European Test Symposium |
Period | 24-27 May 2016 |
Location | Amsterdam, The Netherlands |
ISBN | xxxxx |
Editor(s) | |
published | Published |
Selected Publication | No |
Note | |
Topic(s) | None |
Theme(s) | None |
Project(s) | None |
Group(s) | Computer Engineering |
IEEE BibTex entry:
@proceedings{,
author = "I.O. Agbo and M. Taouil and S. Hamdioui and P Weckx and S. Cosemans and F. Catthoor and W Dehaene",
title = "Read Path Degradation Analysis in SRAM",
conference = "IEEE European Test Symposium",
address = "Amsterdam, The Netherlands",
month = "May",
year = "2016",
editors = ""
}
author = "I.O. Agbo and M. Taouil and S. Hamdioui and P Weckx and S. Cosemans and F. Catthoor and W Dehaene",
title = "Read Path Degradation Analysis in SRAM",
conference = "IEEE European Test Symposium",
address = "Amsterdam, The Netherlands",
month = "May",
year = "2016",
editors = ""
}