Computer Engineering Publications Database (2000-2018) Quantification of Sense Amplifier Offset Voltage Degradation due to Zero- and Run-time Variability 
| Publication Type | Conference Proceedings |
|---|---|
| Title | Quantification of Sense Amplifier Offset Voltage Degradation due to Zero- and Run-time Variability |
| Author(s) | I.O. Agbo M. Taouil S. Hamdioui P Weckx S. Cosemans P. Raghavan F. Catthoor W Dehaene |
| Publication Date | July 2016 |
| Conference Name | IEEE Computer Society Annual Symposium on VLSI |
| Period | 11-13 July 2016 |
| Location | Pittsburgh, U.S.A. |
| ISBN | xxxx |
| Editor(s) | |
| published | Published |
| Selected Publication | No |
| Note | Best Paper Award |
| Topic(s) | None |
| Theme(s) | None |
| Project(s) | None |
| Group(s) | Computer Engineering |
IEEE BibTex entry:
@proceedings{,
author = "I.O. Agbo and M. Taouil and S. Hamdioui and P Weckx and S. Cosemans and P. Raghavan and F. Catthoor and W Dehaene",
title = "Quantification of Sense Amplifier Offset Voltage Degradation due to Zero- and Run-time Variability",
conference = "IEEE Computer Society Annual Symposium on VLSI",
address = "Pittsburgh, U.S.A.",
month = "July",
year = "2016",
editors = ""
}
author = "I.O. Agbo and M. Taouil and S. Hamdioui and P Weckx and S. Cosemans and P. Raghavan and F. Catthoor and W Dehaene",
title = "Quantification of Sense Amplifier Offset Voltage Degradation due to Zero- and Run-time Variability",
conference = "IEEE Computer Society Annual Symposium on VLSI",
address = "Pittsburgh, U.S.A.",
month = "July",
year = "2016",
editors = ""
}