Computer Engineering Publications Database (2000-2018) Lifetime Reliability Assessment with Aging Information from Low-Level Sensors 
| Publication Type | Conference Paper |
|---|---|
| Title | Lifetime Reliability Assessment with Aging Information from Low-Level Sensors |
| Author(s) | Y. Wang S.D. Cotofana L. Fang |
| Publication Date | May 2013 |
| Conference Name | Great Lakes Symposium on VLSI |
| Period | 2-3 May 2013 |
| Location | Paris, France |
| ISBN | 978-978-1-4503-1902-7 |
| Page Numbers | |
| published | Published |
| Selected Publication | No |
| Note | |
| Topic(s) | Reliability |
| Theme(s) | None |
| Project(s) | None |
| Group(s) | Computer Engineering |
IEEE BibTex entry:
@inproceedings{,
author = "Y. Wang and S.D. Cotofana and L. Fang",
title = "Lifetime Reliability Assessment with Aging Information from Low-Level Sensors",
booktitle = "Proc. Great Lakes Symposium on VLSI",
address = "Paris, France",
month = "May",
year = "2013",
pages = ""
}
author = "Y. Wang and S.D. Cotofana and L. Fang",
title = "Lifetime Reliability Assessment with Aging Information from Low-Level Sensors",
booktitle = "Proc. Great Lakes Symposium on VLSI",
address = "Paris, France",
month = "May",
year = "2013",
pages = ""
}