Trends and challenges of SRAM reliability in the nano-scale era 209_trends_and_challenges_of_sram_reliability_in_the_nanoscale.pdf

Publication TypeConference Paper
TitleTrends and challenges of SRAM reliability in the nano-scale era
Author(s)M.S. Khan
S. Hamdioui
Publication DateMarch 2010
Conference Name5th International Conference on Design and Technology of Integrated Systems in Nanoscale Era
Period23-25 March 2010
LocationHammamet, Tunisia
ISBNt.b.s.
Page Numbers1-6
publishedPublished
Selected PublicationNo
Note
Topic(s)None
Theme(s)None
Project(s)None
Group(s)Computer Engineering

IEEE BibTex entry:
@inproceedings{,
author = "M.S. Khan and S. Hamdioui",
title = "Trends and challenges of SRAM reliability in the nano-scale era",
booktitle = "Proc. 5th International Conference on Design and Technology of Integrated Systems in Nanoscale Era",
address = "Hammamet, Tunisia",
month = "March",
year = "2010",
pages = "1-6"
}