ECC Design for Fault-Tolerant Crossbar Memories: A Case Study 
Publication Type | Conference Paper |
---|---|
Title | ECC Design for Fault-Tolerant Crossbar Memories: A Case Study |
Author(s) | N.Z.B. Haron S. Hamdioui Z. Ahyadi |
Publication Date | December 2010 |
Conference Name | 5th IEEE International Design and Test Workshop |
Period | 14-15 December 2010 |
Location | Abu Dhabi, UAE |
ISBN | 978-1-61284-291-2 |
Page Numbers | |
published | Published |
Selected Publication | No |
Note | |
Topic(s) | None |
Theme(s) | None |
Project(s) | None |
Group(s) | Computer Engineering |
IEEE BibTex entry:
@inproceedings{,
author = "N.Z.B. Haron and S. Hamdioui and Z. Ahyadi",
title = "ECC Design for Fault-Tolerant Crossbar Memories: A Case Study",
booktitle = "Proc. 5th IEEE International Design and Test Workshop",
address = "Abu Dhabi, UAE",
month = "December",
year = "2010",
pages = ""
}
author = "N.Z.B. Haron and S. Hamdioui and Z. Ahyadi",
title = "ECC Design for Fault-Tolerant Crossbar Memories: A Case Study",
booktitle = "Proc. 5th IEEE International Design and Test Workshop",
address = "Abu Dhabi, UAE",
month = "December",
year = "2010",
pages = ""
}