Detecting Memory Faults in the Presence of Bit Line Coupling in SRAM Devices 248_detecting_memory_faults_in_the_presence_of_bit_line_coupling.pdf

Publication TypeConference Paper
TitleDetecting Memory Faults in the Presence of Bit Line Coupling in SRAM Devices
Author(s)I.S. Irobi
Z. Al-Ars
S. Hamdioui
Publication DateNovember 2010
Conference NameIEEE International Test Conference
Period2-4 November 2010
LocationAustin, USA
ISBN978-1-4244-7206-2
Page Numbers
publishedPublished
Selected PublicationNo
Note
Topic(s)None
Theme(s)None
Project(s)None
Group(s)Computer Engineering

IEEE BibTex entry:
@inproceedings{,
author = "I.S. Irobi and Z. Al-Ars and S. Hamdioui",
title = "Detecting Memory Faults in the Presence of Bit Line Coupling in SRAM Devices",
booktitle = "Proc. IEEE International Test Conference",
address = "Austin, USA",
month = "November",
year = "2010",
pages = ""
}