Computer Engineering Publications Database (2000-2018) Detecting Memory Faults in the Presence of Bit Line Coupling in SRAM Devices 
| Publication Type | Conference Paper |
|---|---|
| Title | Detecting Memory Faults in the Presence of Bit Line Coupling in SRAM Devices |
| Author(s) | I.S. Irobi Z. Al-Ars S. Hamdioui |
| Publication Date | November 2010 |
| Conference Name | IEEE International Test Conference |
| Period | 2-4 November 2010 |
| Location | Austin, USA |
| ISBN | 978-1-4244-7206-2 |
| Page Numbers | |
| published | Published |
| Selected Publication | No |
| Note | |
| Topic(s) | None |
| Theme(s) | None |
| Project(s) | None |
| Group(s) | Computer Engineering |
IEEE BibTex entry:
@inproceedings{,
author = "I.S. Irobi and Z. Al-Ars and S. Hamdioui",
title = "Detecting Memory Faults in the Presence of Bit Line Coupling in SRAM Devices",
booktitle = "Proc. IEEE International Test Conference",
address = "Austin, USA",
month = "November",
year = "2010",
pages = ""
}
author = "I.S. Irobi and Z. Al-Ars and S. Hamdioui",
title = "Detecting Memory Faults in the Presence of Bit Line Coupling in SRAM Devices",
booktitle = "Proc. IEEE International Test Conference",
address = "Austin, USA",
month = "November",
year = "2010",
pages = ""
}