Computer Engineering Publications Database (2000-2018) Modeling and Mitigating NBTI in Nanoscale Circuits 
| Publication Type | Conference Paper |
|---|---|
| Title | Modeling and Mitigating NBTI in Nanoscale Circuits |
| Author(s) | M.S. Khan S. Hamdioui |
| Publication Date | July 2011 |
| Conference Name | 17th IEEE International On-Line Testing Symposium |
| Period | 13-15 July 2011 |
| Location | Athens, Greece |
| ISBN | t.b.s. |
| Page Numbers | 3-8 |
| published | Published |
| Selected Publication | No |
| Note | |
| Topic(s) | None |
| Theme(s) | None |
| Project(s) | None |
| Group(s) | Computer Engineering |
IEEE BibTex entry:
@inproceedings{,
author = "M.S. Khan and S. Hamdioui",
title = "Modeling and Mitigating NBTI in Nanoscale Circuits",
booktitle = "Proc. 17th IEEE International On-Line Testing Symposium",
address = "Athens, Greece",
month = "July",
year = "2011",
pages = "3-8"
}
author = "M.S. Khan and S. Hamdioui",
title = "Modeling and Mitigating NBTI in Nanoscale Circuits",
booktitle = "Proc. 17th IEEE International On-Line Testing Symposium",
address = "Athens, Greece",
month = "July",
year = "2011",
pages = "3-8"
}