Fault Diagnosis Using Test Primitives in Random Access Memories 393_fault_diagnosis_using_test_primitives_in_random_access_memor.pdf

Publication TypeConference Paper
TitleFault Diagnosis Using Test Primitives in Random Access Memories
Author(s)Z. Al-Ars
S. Hamdioui
Publication DateNovember 2009
Conference Name18th Asian Test Symposium
Period23-26 November 2009
LocationTaichung, Taiwan
ISBNt.b.s.
Page Numbers403-408
publishedPublished
Selected PublicationNo
Note
Topic(s)None
Theme(s)None
Project(s)None
Group(s)Computer Engineering

IEEE BibTex entry:
@inproceedings{,
author = "Z. Al-Ars and S. Hamdioui",
title = "Fault Diagnosis Using Test Primitives in Random Access Memories",
booktitle = "Proc. 18th Asian Test Symposium",
address = "Taichung, Taiwan",
month = "November",
year = "2009",
pages = "403-408"
}