Fault Diagnosis Using Test Primitives in Random Access Memories
Publication Type | Conference Paper |
---|---|
Title | Fault Diagnosis Using Test Primitives in Random Access Memories |
Author(s) | Z. Al-Ars S. Hamdioui |
Publication Date | November 2009 |
Conference Name | 18th Asian Test Symposium |
Period | 23-26 November 2009 |
Location | Taichung, Taiwan |
ISBN | t.b.s. |
Page Numbers | 403-408 |
published | Published |
Selected Publication | No |
Note | |
Topic(s) | None |
Theme(s) | None |
Project(s) | None |
Group(s) | Computer Engineering |
IEEE BibTex entry:
@inproceedings{,
author = "Z. Al-Ars and S. Hamdioui",
title = "Fault Diagnosis Using Test Primitives in Random Access Memories",
booktitle = "Proc. 18th Asian Test Symposium",
address = "Taichung, Taiwan",
month = "November",
year = "2009",
pages = "403-408"
}
author = "Z. Al-Ars and S. Hamdioui",
title = "Fault Diagnosis Using Test Primitives in Random Access Memories",
booktitle = "Proc. 18th Asian Test Symposium",
address = "Taichung, Taiwan",
month = "November",
year = "2009",
pages = "403-408"
}