Computer Engineering Publications Database (2000-2018) Worst-Case Bit Line Coupling Backgrounds for Open Defects in SRAM Cells 
| Publication Type | Conference Paper |
|---|---|
| Title | Worst-Case Bit Line Coupling Backgrounds for Open Defects in SRAM Cells |
| Author(s) | I.S. Irobi Z. Al-Ars |
| Publication Date | November 2009 |
| Conference Name | 20th Annual Workshop on Circuits, Systems and Signal Processing |
| Period | 26-27 November 2009 |
| Location | Veldhoven, The Netherlands |
| ISBN | t.b.s. |
| Page Numbers | |
| published | Published |
| Selected Publication | No |
| Note | |
| Topic(s) | None |
| Theme(s) | None |
| Project(s) | None |
| Group(s) | Computer Engineering |
IEEE BibTex entry:
@inproceedings{,
author = "I.S. Irobi and Z. Al-Ars",
title = "Worst-Case Bit Line Coupling Backgrounds for Open Defects in SRAM Cells",
booktitle = "Proc. 20th Annual Workshop on Circuits, Systems and Signal Processing",
address = "Veldhoven, The Netherlands",
month = "November",
year = "2009",
pages = ""
}
author = "I.S. Irobi and Z. Al-Ars",
title = "Worst-Case Bit Line Coupling Backgrounds for Open Defects in SRAM Cells",
booktitle = "Proc. 20th Annual Workshop on Circuits, Systems and Signal Processing",
address = "Veldhoven, The Netherlands",
month = "November",
year = "2009",
pages = ""
}