Using RRNS Codes for Cluster Faults Tolerance in Hybrid Memories
Publication Type | Conference Paper |
---|---|
Title | Using RRNS Codes for Cluster Faults Tolerance in Hybrid Memories |
Author(s) | N.Z.B. Haron S. Hamdioui |
Publication Date | October 2009 |
Conference Name | 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems |
Period | 7-9 October 2009 |
Location | Chicago, USA |
ISBN | t.b.s. |
Page Numbers | 85-93 |
published | Published |
Selected Publication | No |
Note | |
Topic(s) | None |
Theme(s) | None |
Project(s) | None |
Group(s) | Computer Engineering |
IEEE BibTex entry:
@inproceedings{,
author = "N.Z.B. Haron and S. Hamdioui",
title = "Using RRNS Codes for Cluster Faults Tolerance in Hybrid Memories",
booktitle = "Proc. 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems",
address = "Chicago, USA",
month = "October",
year = "2009",
pages = "85-93"
}
author = "N.Z.B. Haron and S. Hamdioui",
title = "Using RRNS Codes for Cluster Faults Tolerance in Hybrid Memories",
booktitle = "Proc. 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems",
address = "Chicago, USA",
month = "October",
year = "2009",
pages = "85-93"
}