Evaluation of SRAM Faulty Behavior Under Bit Line Coupling 516_evaluation_of_sram_faulty_behavior_under_bit_line_coupling.pdf

Publication TypeConference Paper
TitleEvaluation of SRAM Faulty Behavior Under Bit Line Coupling
Author(s)Z. Al-Ars
S. Hamdioui
Publication DateDecember 2008
Conference Name3rd IEEE International Design and Test Workshop
Period20-22 December 2008
LocationMonastir, Tunisia
ISBNt.b.s.
Page Numbers
publishedPublished
Selected PublicationNo
Note
Topic(s)None
Theme(s)None
Project(s)None
Group(s)Computer Engineering

IEEE BibTex entry:
@inproceedings{,
author = "Z. Al-Ars and S. Hamdioui",
title = "Evaluation of SRAM Faulty Behavior Under Bit Line Coupling",
booktitle = "Proc. 3rd IEEE International Design and Test Workshop",
address = "Monastir, Tunisia",
month = "December",
year = "2008",
pages = ""
}