Computer Engineering Publications Database (2000-2018) A Unified Aging Model of NBTI and HCI Degradation towards Lifetime Reliability Management for Nanoscale MOSFET Circuits 
| Publication Type | Conference Paper |
|---|---|
| Title | A Unified Aging Model of NBTI and HCI Degradation towards Lifetime Reliability Management for Nanoscale MOSFET Circuits |
| Author(s) | Y. Wang S.D. Cotofana |
| Publication Date | June 2011 |
| Conference Name | IEEE/ACM International Symposium on Nanoscale Architectures |
| Period | 8-9 June 2011 |
| Location | San Diego, USA |
| ISBN | 978-1-4577-0994-4 |
| Page Numbers | |
| published | Published |
| Selected Publication | No |
| Note | |
| Topic(s) | None |
| Theme(s) | None |
| Project(s) | None |
| Group(s) | Computer Engineering |
IEEE BibTex entry:
@inproceedings{,
author = "Y. Wang and S.D. Cotofana",
title = "A Unified Aging Model of NBTI and HCI Degradation towards Lifetime Reliability Management for Nanoscale MOSFET Circuits",
booktitle = "Proc. IEEE/ACM International Symposium on Nanoscale Architectures",
address = "San Diego, USA",
month = "June",
year = "2011",
pages = ""
}
author = "Y. Wang and S.D. Cotofana",
title = "A Unified Aging Model of NBTI and HCI Degradation towards Lifetime Reliability Management for Nanoscale MOSFET Circuits",
booktitle = "Proc. IEEE/ACM International Symposium on Nanoscale Architectures",
address = "San Diego, USA",
month = "June",
year = "2011",
pages = ""
}