Computer Engineering Publications Database (2000-2018) Trends in Tests and Failure Mechanisms in Deep Sub-micron Technologies 
| Publication Type | Conference Paper |
|---|---|
| Title | Trends in Tests and Failure Mechanisms in Deep Sub-micron Technologies |
| Author(s) | S. Hamdioui Z. Al-Ars L. Mhamdi G.N. Gaydadjiev |
| Publication Date | September 2006 |
| Conference Name | International Conference on Design and Test of Integrated Systems in Nanoscale Technology |
| Period | 5-7 September 2006 |
| Location | Tunis, Tunesia |
| ISBN | 0-7803-9726-6 |
| Page Numbers | 216-221 |
| published | Published |
| Selected Publication | No |
| Note | |
| Topic(s) | None |
| Theme(s) | None |
| Project(s) | None |
| Group(s) | Computer Engineering |
IEEE BibTex entry:
@inproceedings{,
author = "S. Hamdioui and Z. Al-Ars and L. Mhamdi and G.N. Gaydadjiev",
title = "Trends in Tests and Failure Mechanisms in Deep Sub-micron Technologies",
booktitle = "Proc. International Conference on Design and Test of Integrated Systems in Nanoscale Technology",
address = "Tunis, Tunesia",
month = "September",
year = "2006",
pages = "216-221"
}
author = "S. Hamdioui and Z. Al-Ars and L. Mhamdi and G.N. Gaydadjiev",
title = "Trends in Tests and Failure Mechanisms in Deep Sub-micron Technologies",
booktitle = "Proc. International Conference on Design and Test of Integrated Systems in Nanoscale Technology",
address = "Tunis, Tunesia",
month = "September",
year = "2006",
pages = "216-221"
}