Computer Engineering Publications Database (2000-2018) Bitline-Coupled Precharge Faults and Their Detection in Memory Devices 
| Publication Type | Conference Paper |
|---|---|
| Title | Bitline-Coupled Precharge Faults and Their Detection in Memory Devices |
| Author(s) | Z. Al-Ars S. Hamdioui G. Mueller J. Vollrath |
| Publication Date | May 2006 |
| Conference Name | 11th IEE European Test Symposium |
| Period | 21-24 May 2006 |
| Location | Southampton, UK |
| ISBN | 0-7695-2566-0 |
| Page Numbers | |
| published | Published |
| Selected Publication | No |
| Note | |
| Topic(s) | None |
| Theme(s) | None |
| Project(s) | None |
| Group(s) | Computer Engineering |
IEEE BibTex entry:
@inproceedings{,
author = "Z. Al-Ars and S. Hamdioui and G. Mueller and J. Vollrath",
title = "Bitline-Coupled Precharge Faults and Their Detection in Memory Devices",
booktitle = "Proc. 11th IEE European Test Symposium",
address = "Southampton, UK",
month = "May",
year = "2006",
pages = ""
}
author = "Z. Al-Ars and S. Hamdioui and G. Mueller and J. Vollrath",
title = "Bitline-Coupled Precharge Faults and Their Detection in Memory Devices",
booktitle = "Proc. 11th IEE European Test Symposium",
address = "Southampton, UK",
month = "May",
year = "2006",
pages = ""
}