Influence of Bit Line Coupling and Twisting on the Faulty Behavior of DRAMs 771_influence_of_bit_line_coupling_and_twisting_on_the_faulty_be.pdf

Publication TypeJournal Paper
TitleInfluence of Bit Line Coupling and Twisting on the Faulty Behavior of DRAMs
Author(s)Z. Al-Ars
S. Hamdioui
A.J. van de Goor
S. Al-Harbi
Publication DateDecember 2006
Journal NameIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Volume25
Issue12
Page Numbers2989-2996
ISSN0278-0070
publishedPublished
Selected PublicationNo
Note
Topic(s)None
Theme(s)None
Project(s)None
Group(s)Computer Engineering

IEEE BibTex entry:
@article{,
author = "Z. Al-Ars and S. Hamdioui and A.J. van de Goor and S. Al-Harbi",
title = "Influence of Bit Line Coupling and Twisting on the Faulty Behavior of DRAMs",
journal = "IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems",
volume = "25",
issue = "12",
month = "December",
year = "2006",
pages = "2989-2996"
}