Influence of Bit Line Twisting on the Faulty Behavior of DRAMs
Publication Type | Conference Paper |
---|---|
Title | Influence of Bit Line Twisting on the Faulty Behavior of DRAMs |
Author(s) | Z. Al-Ars M. Herzog I. Schanstra A.J. van de Goor |
Publication Date | August 2004 |
Conference Name | 12th IEEE International Workshop on Memory Technology, Design, and Testing |
Period | 9-10 August 2004 |
Location | San Jose, USA |
ISBN | 0-7695-2193-2 |
Page Numbers | 32-37 |
published | Published |
Selected Publication | No |
Note | |
Topic(s) | None |
Theme(s) | None |
Project(s) | None |
Group(s) | Computer Engineering |
IEEE BibTex entry:
@inproceedings{,
author = "Z. Al-Ars and M. Herzog and I. Schanstra and A.J. van de Goor",
title = "Influence of Bit Line Twisting on the Faulty Behavior of DRAMs",
booktitle = "Proc. 12th IEEE International Workshop on Memory Technology, Design, and Testing",
address = "San Jose, USA",
month = "August",
year = "2004",
pages = "32-37"
}
author = "Z. Al-Ars and M. Herzog and I. Schanstra and A.J. van de Goor",
title = "Influence of Bit Line Twisting on the Faulty Behavior of DRAMs",
booktitle = "Proc. 12th IEEE International Workshop on Memory Technology, Design, and Testing",
address = "San Jose, USA",
month = "August",
year = "2004",
pages = "32-37"
}