Influence of Bit Line Twisting on the Faulty Behavior of DRAMs 911_influence_of_bit_line_twisting_on_the_faulty_behavior_of_dra.pdf

Publication TypeConference Paper
TitleInfluence of Bit Line Twisting on the Faulty Behavior of DRAMs
Author(s)Z. Al-Ars
M. Herzog
I. Schanstra
A.J. van de Goor
Publication DateAugust 2004
Conference Name12th IEEE International Workshop on Memory Technology, Design, and Testing
Period9-10 August 2004
LocationSan Jose, USA
ISBN0-7695-2193-2
Page Numbers32-37
publishedPublished
Selected PublicationNo
Note
Topic(s)None
Theme(s)None
Project(s)None
Group(s)Computer Engineering

IEEE BibTex entry:
@inproceedings{,
author = "Z. Al-Ars and M. Herzog and I. Schanstra and A.J. van de Goor",
title = "Influence of Bit Line Twisting on the Faulty Behavior of DRAMs",
booktitle = "Proc. 12th IEEE International Workshop on Memory Technology, Design, and Testing",
address = "San Jose, USA",
month = "August",
year = "2004",
pages = "32-37"
}