Computer Engineering Publications Database (2000-2018) Memory Fault Modeling Trends: A Case Study 
| Publication Type | Journal Paper |
|---|---|
| Title | Memory Fault Modeling Trends: A Case Study |
| Author(s) | S. Hamdioui R. Wadsworth J.D. Reyes A.J. van de Goor |
| Publication Date | June 2004 |
| Journal Name | Journal of Electronic Testing: Theory and Applications |
| Volume | 20 |
| Issue | 3 |
| Page Numbers | 245-255 |
| ISSN | 0923-8174 |
| published | Published |
| Selected Publication | No |
| Note | |
| Topic(s) | None |
| Theme(s) | None |
| Project(s) | None |
| Group(s) | Computer Engineering |
IEEE BibTex entry:
@article{,
author = "S. Hamdioui and R. Wadsworth and J.D. Reyes and A.J. van de Goor",
title = "Memory Fault Modeling Trends: A Case Study",
journal = "Journal of Electronic Testing: Theory and Applications",
volume = "20",
issue = "3",
month = "June",
year = "2004",
pages = "245-255"
}
author = "S. Hamdioui and R. Wadsworth and J.D. Reyes and A.J. van de Goor",
title = "Memory Fault Modeling Trends: A Case Study",
journal = "Journal of Electronic Testing: Theory and Applications",
volume = "20",
issue = "3",
month = "June",
year = "2004",
pages = "245-255"
}