Computer Engineering Publications Database (2000-2018) Tests for Address Decoder Delay Faults in RAMs Due to Inter-Gate Opens 
| Publication Type | Conference Paper |
|---|---|
| Title | Tests for Address Decoder Delay Faults in RAMs Due to Inter-Gate Opens |
| Author(s) | A.J. van de Goor S. Hamdioui Z. Al-Ars |
| Publication Date | May 2004 |
| Conference Name | 9th IEEE European Test Symposium |
| Period | 23-26 May 2004 |
| Location | Corsica, France |
| ISBN | t.b.s. |
| Page Numbers | 146-151 |
| published | Published |
| Selected Publication | No |
| Note | |
| Topic(s) | None |
| Theme(s) | None |
| Project(s) | None |
| Group(s) | Computer Engineering |
IEEE BibTex entry:
@inproceedings{,
author = "A.J. van de Goor and S. Hamdioui and Z. Al-Ars",
title = "Tests for Address Decoder Delay Faults in RAMs Due to Inter-Gate Opens",
booktitle = "Proc. 9th IEEE European Test Symposium",
address = "Corsica, France",
month = "May",
year = "2004",
pages = "146-151"
}
author = "A.J. van de Goor and S. Hamdioui and Z. Al-Ars",
title = "Tests for Address Decoder Delay Faults in RAMs Due to Inter-Gate Opens",
booktitle = "Proc. 9th IEEE European Test Symposium",
address = "Corsica, France",
month = "May",
year = "2004",
pages = "146-151"
}