Computer Engineering Publications Database (2000-2018) Effects of Bit Line Coupling on the Faulty Behavior of DRAMs 
| Publication Type | Conference Paper |
|---|---|
| Title | Effects of Bit Line Coupling on the Faulty Behavior of DRAMs |
| Author(s) | Z. Al-Ars S. Hamdioui A.J. van de Goor |
| Publication Date | April 2004 |
| Conference Name | 22nd IEEE VLSI Test Symposium |
| Period | 25-29 April 2004 |
| Location | Napa, USA |
| ISBN | 0-7695-2134-7 |
| Page Numbers | 117-122 |
| published | Published |
| Selected Publication | No |
| Note | |
| Topic(s) | None |
| Theme(s) | None |
| Project(s) | None |
| Group(s) | Computer Engineering |
IEEE BibTex entry:
@inproceedings{,
author = "Z. Al-Ars and S. Hamdioui and A.J. van de Goor",
title = "Effects of Bit Line Coupling on the Faulty Behavior of DRAMs",
booktitle = "Proc. 22nd IEEE VLSI Test Symposium",
address = "Napa, USA",
month = "April",
year = "2004",
pages = "117-122"
}
author = "Z. Al-Ars and S. Hamdioui and A.J. van de Goor",
title = "Effects of Bit Line Coupling on the Faulty Behavior of DRAMs",
booktitle = "Proc. 22nd IEEE VLSI Test Symposium",
address = "Napa, USA",
month = "April",
year = "2004",
pages = "117-122"
}