Testing for Parasitic Memory Effect in SRAMs 99_testing_for_parasitic_memory_effect_in_srams.pdf

Publication TypeConference Paper
TitleTesting for Parasitic Memory Effect in SRAMs
Author(s)I.S. Irobi
Z. Al-Ars
S. Hamdioui
Publication DateNovember 2011
Conference Name20th Asian Test Symposium
Period20-23 November 2011
LocationNew Delhi, India
ISBNt.b.s.
Page Numbers
publishedPublished
Selected PublicationNo
Note
Topic(s)None
Theme(s)None
Project(s)None
Group(s)Computer Engineering

IEEE BibTex entry:
@inproceedings{,
author = "I.S. Irobi and Z. Al-Ars and S. Hamdioui",
title = "Testing for Parasitic Memory Effect in SRAMs",
booktitle = "Proc. 20th Asian Test Symposium",
address = "New Delhi, India",
month = "November",
year = "2011",
pages = ""
}