Testing for Parasitic Memory Effect in SRAMs
Publication Type | Conference Paper |
---|---|
Title | Testing for Parasitic Memory Effect in SRAMs |
Author(s) | I.S. Irobi Z. Al-Ars S. Hamdioui |
Publication Date | November 2011 |
Conference Name | 20th Asian Test Symposium |
Period | 20-23 November 2011 |
Location | New Delhi, India |
ISBN | t.b.s. |
Page Numbers | |
published | Published |
Selected Publication | No |
Note | |
Topic(s) | None |
Theme(s) | None |
Project(s) | None |
Group(s) | Computer Engineering |
IEEE BibTex entry:
@inproceedings{,
author = "I.S. Irobi and Z. Al-Ars and S. Hamdioui",
title = "Testing for Parasitic Memory Effect in SRAMs",
booktitle = "Proc. 20th Asian Test Symposium",
address = "New Delhi, India",
month = "November",
year = "2011",
pages = ""
}
author = "I.S. Irobi and Z. Al-Ars and S. Hamdioui",
title = "Testing for Parasitic Memory Effect in SRAMs",
booktitle = "Proc. 20th Asian Test Symposium",
address = "New Delhi, India",
month = "November",
year = "2011",
pages = ""
}