Computer Engineering Publications Database (2000-2018) Detecting Faults in Peripheral Circuits and an Evaluation of SRAM Tests 
| Publication Type | Conference Paper |
|---|---|
| Title | Detecting Faults in Peripheral Circuits and an Evaluation of SRAM Tests |
| Author(s) | A.J. van de Goor S. Hamdioui R. Wadsworth |
| Publication Date | October 2004 |
| Conference Name | International Test Conference |
| Period | 26-28 October 2004 |
| Location | Charlotte, USA |
| ISBN | 0-7803-8581-0 |
| Page Numbers | 114-123 |
| published | Published |
| Selected Publication | No |
| Note | |
| Topic(s) | None |
| Theme(s) | None |
| Project(s) | None |
| Group(s) | Computer Engineering |
IEEE BibTex entry:
@inproceedings{,
author = "A.J. van de Goor and S. Hamdioui and R. Wadsworth",
title = "Detecting Faults in Peripheral Circuits and an Evaluation of SRAM Tests",
booktitle = "Proc. International Test Conference",
address = "Charlotte, USA",
month = "October",
year = "2004",
pages = "114-123"
}
author = "A.J. van de Goor and S. Hamdioui and R. Wadsworth",
title = "Detecting Faults in Peripheral Circuits and an Evaluation of SRAM Tests",
booktitle = "Proc. International Test Conference",
address = "Charlotte, USA",
month = "October",
year = "2004",
pages = "114-123"
}