M. Klaus
Name | M. Klaus |
---|---|
First Name | |
Author Type | External |
Affiliation |
Publications
M. Klaus, A.J. van de Goor,
Tests for resistive and capacitive defects in address decoders
(November 2001),
10th Asian Test Symposium (ATS 2001), 19-21 November 2001, Kyoto, Japan
[Conference Paper]