A.J. van de Goor
Name | A.J. van de Goor |
---|---|
First Name | Ad |
Author Type | External |
Affiliation | TU Delft (Emeritus) |
Publications
S. Hamdioui, Z. Al-Ars, G.N. Gaydadjiev, A.J. van de Goor,
GENERIC MARCH ELEMENT BASED MEMORY BUILT-IN SELF TEST
(April 2013),
filed in USA
[Patent]
A.J. van de Goor, H. Kukner, S. Hamdioui,
Optimizing Memory BIST Address Generator Implementations
(April 2011),
6th International conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS 2011), 6-8 April 2011, Athens, Greece
, Best Paper Award
[Conference Paper]
![72_optimizing_memory_bist_address_generator_implementations.pdf](/images/pdf-a.png)
A.J. van de Goor, S. Hamdioui, H. Kukner,
Generic, Orthogonal and Low-Cost March Element-based Memory BIST
(January 2011),
IEEE International Test Conference (IEEE ITC), 20-22 Sept, Anaheim, CA, USA
[Conference Proceedings]
![1336_generic_orthogonal_and_lowcost_march_elementbased_memory.pdf](/images/pdf-a.png)
A.J. van de Goor, S. Hamdioui,
MBIST Architecture Framework based on Orthogonal Constructs
(December 2010),
5th IEEE International Design and Test Workshop (IDT 2010), 14-15 December 2010, Abu Dhabi, UAE
[Conference Paper]
A.J. van de Goor, C. Jung, S. Hamdioui, G.N. Gaydadjiev,
Low-cost, Customized and Flexible SRAM MBIST Engine
(April 2010),
13th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS 2010), 14-16 April 2010, Vienna, Austria
[Conference Paper]
A.J. van de Goor, S. Hamdioui, G.N. Gaydadjiev,
Using a CISC microcontroller to test embedded memories
(April 2010),
13th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS 2010), 14-16 April 2010, Vienna, Austria
[Conference Paper]
A.J. van de Goor, G.N. Gaydadjiev, S. Hamdioui,
Memory Testing with a RISC Microcontroller
(March 2010),
Design, Automation and Test in Europe (DATE 2010), 8-12 March 2010, Dresden, Germany
[Conference Paper]
![213_memory_testing_with_a_risc_microcontroller.pdf](/images/pdf-a.png)
A.J. van de Goor, S. Hamdioui, G.N. Gaydadjiev,
New Algorithms for Address Decoder Delay Faults and Bit Line Imbalance Faults
(November 2009),
18th Asian Test Symposium (ATS 2009), 23-26 November 2009, Taichung, Taiwan
[Conference Paper]
![392_new_algorithms_for_address_decoder_delay_faults_and_bit_line.pdf](/images/pdf-a.png)
Z. Al-Ars, S. Hamdioui, A.J. van de Goor, G. Mueller,
Defect Oriented Testing of the Strap Problem Under Process Variations in DRAMs
(October 2008),
IEEE International Test Conference (ITC 2008), 26-31 October 2008, Santa Clara, USA
[Conference Paper]
![545_defect_oriented_testing_of_the_strap_problem_under_process_v.pdf](/images/pdf-a.png)
S. Hamdioui, Z. Al-Ars, G.N. Gaydadjiev, A.J. van de Goor,
An Investigation on Capacitive Coupling in RAM Address Decoders
(December 2007),
2nd International Design and Test Workshop (IDT 2007), 16-18 December 2007, Cairo, Egypt
[Conference Paper]
![641_an_investigation_on_capacitive_coupling_in_ram_address_decod.pdf](/images/pdf-a.png)
Z. Al-Ars, S. Hamdioui, A.J. van de Goor, S. Al-Harbi,
Influence of Bit Line Coupling and Twisting on the Faulty Behavior of DRAMs
(December 2006),
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), volume 25, issue 12
[Journal Paper]
![771_influence_of_bit_line_coupling_and_twisting_on_the_faulty_be.pdf](/images/pdf-a.png)
S. Hamdioui, Z. Al-Ars, A.J. van de Goor,
Opens and Delay Faults in CMOS RAM Address Decoder
(December 2006),
IEEE Transactions on Computers (TC), volume 55, issue 12
[Journal Paper]
![768_opens_and_delay_faults_in_cmos_ram_address_decoder.pdf](/images/pdf-a.png)
Z. Al-Ars, S. Hamdioui, A.J. van de Goor, G.N. Gaydadjiev, J. Vollrath,
DRAM-Specific Space of Memory Tests
(October 2006),
IEEE International Test Conference (ITC 2006), 22-27 October 2006, Santa Clara, USA
[Conference Paper]
![798_dramspecific_space_of_memory_tests.pdf](/images/pdf-a.png)
Z. Al-Ars, S. Hamdioui, A.J. van de Goor,
Space of DRAM Fault Models and Corresponding Testing
(March 2006),
Design, Automation and Test in Europe (DATE 2006), 6-10 March 2006, Munich, Germany
[Conference Paper]
![761_space_of_dram_fault_models_and_corresponding_testing.pdf](/images/pdf-a.png)
S. Hamdioui, A.J. van de Goor, J.D. Reyes, M. Rodgers,
Memory Test Experiment: Industrial Results and Data
(January 2006),
IEE Proceedings - Computers and Digital Techniques, volume 153, issue 1
[Journal Paper]
![807_memory_test_experiment_industrial_results_and_data.pdf](/images/pdf-a.png)
S. Hamdioui, Z. Al-Ars, A.J. van de Goor, R. Wadsworth,
Impact of Stresses on the Fault Coverage of Memory Tests
(August 2005),
IEEE International Workshop on Memory Technology, Design and Testing (MTDT 2005), 3-5 August 2005, Taipei, Taiwan
[Conference Paper]
![819_impact_of_stresses_on_the_fault_coverage_of_memory_tests.pdf](/images/pdf-a.png)
Z. Al-Ars, S. Hamdioui, G. Mueller, A.J. van de Goor,
Framework for Fault Analysis and Test Generation in DRAMs
(March 2005),
Design, Automation and Test in Europe Conference and Exposition (DATE 2005), 7-11 March 2005, Munich, Germany
[Conference Paper]
![857_framework_for_fault_analysis_and_test_generation_in_drams.pdf](/images/pdf-a.png)
A.J. van de Goor, S. Hamdioui, R. Wadsworth,
Detecting Faults in Peripheral Circuits and an Evaluation of SRAM Tests
(October 2004),
International Test Conference (ITC 2004), 26-28 October 2004, Charlotte, USA
[Conference Paper]
![992_detecting_faults_in_peripheral_circuits_and_an_evaluation_of.pdf](/images/pdf-a.png)
A.J. van de Goor,
An industrial evaluation of DRAM tests
(September 2004),
IEEE Design & Test of Computers (D&ToC), volume 21, issue 5
[Journal Paper]
S. Hamdioui, G.N. Gaydadjiev, A.J. van de Goor,
The State-of-the-art and Future Trends in Testing Embedded Memories
(August 2004),
12th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2004), 9-10 August 2004, San Jose, USA
[Conference Paper]
![913_the_stateoftheart_and_future_trends_in_testing_embedded_m.pdf](/images/pdf-a.png)
A.J. van de Goor, S. Hamdioui, Z. Al-Ars,
The Effectiveness of Scan Test and Its New Variants
(August 2004),
12th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2004), 9-10 August 2004, San Jose, USA
[Conference Paper]
![912_the_effectiveness_of_scan_test_and_its_new_variants.pdf](/images/pdf-a.png)
Z. Al-Ars, M. Herzog, I. Schanstra, A.J. van de Goor,
Influence of Bit Line Twisting on the Faulty Behavior of DRAMs
(August 2004),
12th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2004), 9-10 August 2004, San Jose, USA
[Conference Paper]
![911_influence_of_bit_line_twisting_on_the_faulty_behavior_of_dra.pdf](/images/pdf-a.png)
S. Hamdioui, R. Wadsworth, J.D. Reyes, A.J. van de Goor,
Memory Fault Modeling Trends: A Case Study
(June 2004),
Journal of Electronic Testing: Theory and Applications (JETTA), volume 20, issue 3
[Journal Paper]
![925_memory_fault_modeling_trends_a_case_study.pdf](/images/pdf-a.png)
A.J. van de Goor, S. Hamdioui, Z. Al-Ars,
Tests for Address Decoder Delay Faults in RAMs Due to Inter-Gate Opens
(May 2004),
9th IEEE European Test Symposium (ETS 2004), 23-26 May 2004, Corsica, France
[Conference Paper]
![936_tests_for_address_decoder_delay_faults_in_rams_due_to_inter.pdf](/images/pdf-a.png)
S. Hamdioui, Z. Al-Ars, A.J. van de Goor, M. Rodgers,
Linked Faults in Random Access Memories: Concept, Fault Models, Test Algorithms, and Industrial Results
(May 2004),
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), volume 23, issue 5
[Journal Paper]
![931_linked_faults_in_random_access_memories_concept_fault_mode.pdf](/images/pdf-a.png)
Z. Al-Ars, S. Hamdioui, A.J. van de Goor,
Effects of Bit Line Coupling on the Faulty Behavior of DRAMs
(April 2004),
22nd IEEE VLSI Test Symposium (VTS 2004), 25-29 April 2004, Napa, USA
[Conference Paper]
![944_effects_of_bit_line_coupling_on_the_faulty_behavior_of_drams.pdf](/images/pdf-a.png)
Z. Al-Ars, A.J. van de Goor,
Soft Faults and the Importance of Stresses in Memory Testing
(February 2004),
Design, Automation and Test in Europe Conference and Exposition (DATE 2004), 16-20 February 2004, Paris, France
[Conference Paper]
![954_soft_faults_and_the_importance_of_stresses_in_memory_testing.pdf](/images/pdf-a.png)
Z. Al-Ars, A.J. van de Goor,
Analyzing the Impact of Process Variations on DRAM Testing Using Border Resistance Traces
(November 2003),
12th Asian Test Symposium (ATS 2003), 17-19 November 2003, Xian, China
[Conference Paper]
![1068_analyzing_the_impact_of_process_variations_on_dram_testing.pdf](/images/pdf-a.png)
S. Hamdioui, G.N. Gaydadjiev, A.J. van de Goor,
A Fault Primitive Based Analysis of Dynamic Memory Faults
(November 2003),
14th Annual Workshop on Circuits, Systems and Signal Processing (ProRISC 2003), 27-29 November 2003, Veldhoven, The Netherlands
[Conference Paper]
![1067_a_fault_primitive_based_analysis_of_dynamic_memory_faults.pdf](/images/pdf-a.png)
S. Hamdioui, Z. Al-Ars, A.J. van de Goor, M. Rodgers,
March SL: A Test For All Static Linked Memory Faults
(November 2003),
12th Asian Test Symposium (ATS 2003), 17-19 November 2003, Xian, China
[Conference Paper]
![1065_march_sl_a_test_for_all_static_linked_memory_faults.pdf](/images/pdf-a.png)
A.J. van de Goor, I.B.S. Tlili,
A systematic method for modifying march tests for bit-oriented memories into tests for word-oriented memories
(October 2003),
IEEE Transactions on Computers (TC), volume 52, issue 10
[Journal Paper]
![1081_a_systematic_method_for_modifying_march_tests_for_bitorien.pdf](/images/pdf-a.png)
Z. Al-Ars, A.J. van de Goor,
Test generation and optimization for DRAM cell defects using electrical simulation
(October 2003),
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), volume 22, issue 10
[Journal Paper]
![1082_test_generation_and_optimization_for_dram_cell_defects_usin.pdf](/images/pdf-a.png)
Z. Al-Ars, S. Hamdioui, A.J. van de Goor,
A Fault Primitive Based Analysis of Linked Faults in RAMs
(July 2003),
11th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2003), 28-29 July 2003, San Jose, USA
[Conference Paper]
![1021_a_fault_primitive_based_analysis_of_linked_faults_in_rams.pdf](/images/pdf-a.png)
Z. Al-Ars, A.J. van de Goor,
Systematic memory test generation for dram defects causing two floating nodes
(July 2003),
11th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2003), 28-29 July 2003, San Jose, USA
[Conference Paper]
![1024_systematic_memory_test_generation_for_dram_defects_causing.pdf](/images/pdf-a.png)
S. Hamdioui, R. Wadsworth, J.D. Reyes, A.J. van de Goor,
Importance of Dynamic Faults for New SRAM Technologies
(May 2003),
8th IEEE European Test Workshop (ETW 2003), 25-28 May 2003, Maastricht, The Netherlands
[Conference Paper]
![1035_importance_of_dynamic_faults_for_new_sram_technologies.pdf](/images/pdf-a.png)
A.J. van de Goor,
Testing (embedded) memories : new fault models, test, Dft, BIST, BISR and industrial results
(May 2003),
8th IEEE European Test Workshop (ETW 2003), 25-28 May 2003, Maastricht, The Netherlands
[Conference Paper]
M.J. Geuzebroek, A.J. van de Goor,
TPI for improving PR Fault Coverage of Boolean and Three-State Circuits
(May 2003),
8th IEEE European Test Workshop (ETW 2003), 25-28 May 2003, Maastricht, The Netherlands
[Conference Paper]
![1034_tpi_for_improving_pr_fault_coverage_of_boolean_and_threest.pdf](/images/pdf-a.png)
S. Hamdioui, A.J. van de Goor, M. Rodgers,
Detecting intra-word faults in word-oriented memories
(April 2003),
21st IEEE VLSI Test Symposium (VTS 2003), 27 April - 1 May 2003, Napa Valley, USA
[Conference Paper]
![1040_detecting_intraword_faults_in_wordoriented_memories.pdf](/images/pdf-a.png)
S. Hamdioui, Z. Al-Ars, A.J. van de Goor, M. Rodgers,
Dynamic Faults in Random-Access-Memories: Concept, Fault Models and Tests
(April 2003),
Journal of Electronic Testing: Theory and Applications (JETTA), volume 19, issue 2
[Journal Paper]
![1039_dynamic_faults_in_randomaccessmemories_concept_fault_mo.pdf](/images/pdf-a.png)
I. Schanstra, A.J. van de Goor,
Consequences of RAM bitline twisting for test coverage
(March 2003),
Design, Automation and Test in Europe Conference and Exposition (DATE 2003), 3-7 March 2003, Munich, Germany
[Conference Paper]
![1047_consequences_of_ram_bitline_twisting_for_test_coverage.pdf](/images/pdf-a.png)
Z. Al-Ars, A.J. van de Goor,
Static and Dynamic Behavior of Memory Cell Array Spot Defects in Embedded DRAMs
(March 2003),
IEEE Transactions on Computers (TC), volume 52, issue 3
[Journal Paper]
![1046_static_and_dynamic_behavior_of_memory_cell_array_spot_defec.pdf](/images/pdf-a.png)
Z. Al-Ars, A.J. van de Goor, J. Braun, D. Richter,
Optimizing Stresses for Testing DRAM Cell Defects Using Electrical Simulation
(March 2003),
Design, Automation and Test in Europe Conference and Exposition (DATE 2003), 3-7 March 2003, Munich, Germany
[Conference Paper]
![1044_optimizing_stresses_for_testing_dram_cell_defects_using_ele.pdf](/images/pdf-a.png)
I. Schanstra, A.J. van de Goor,
Logical and topological testing of scrambled RAMs
(February 2003),
4th IEEE Latin American Test Workshop (LATW 2003), 16-19 February 2003, Natal, Brazil
[Conference Paper]
A.J. van de Goor,
Memory Testing
(January 2003),
Book Title "Testing of Digital Systems", Published by Cambridge University Press
[Book Chapter]
A.J. van de Goor,
Introduction
(January 2003),
Book Title "Testing of Digital Systems", Published by Cambridge University Press
[Book Chapter]
Z. Al-Ars, A.J. van de Goor,
DRAM Specific approximation of the faulty behavior of cell defects
(November 2002),
11th Asian Test Symposium (ATS 2002), 18-20 November 2002, Guam, USA
[Conference Paper]
![1148_dram_specific_approximation_of_the_faulty_behavior_of_cell.pdf](/images/pdf-a.png)
M.J. Geuzebroek, J. van der Linden, A.J. van de Goor,
Test point insertion that facilitates ATPG in reducing test time and data volume
(October 2002),
IEEE International Test Conference (ITC 2002), 7-10 October 2002, Baltimore, USA
[Conference Paper]
![1157_test_point_insertion_that_facilitates_atpg_in_reducing_test.pdf](/images/pdf-a.png)
S. Hamdioui, A.J. van de Goor, M. Rodgers,
March SS: A test for all static simple RAM faults
(July 2002),
10th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2002), 10-12 July 2002, Isle of Bendor, France
[Conference Paper]
![1107_march_ss_a_test_for_all_static_simple_ram_faults.pdf](/images/pdf-a.png)
S. Hamdioui, A.J. van de Goor, M. Rodgers,
DPM Reduction On Dual Port Caches
(May 2002),
7th IEEE European Test Workshop (ETW 2002), 26-29 May 2002, Corfu, Greece
[Conference Paper]
![1116_dpm_reduction_on_dual_port_caches.pdf](/images/pdf-a.png)
S. Hamdioui, A.J. van de Goor,
Efficient Tests for Realistic Faults in Dual-Port Memories
(May 2002),
IEEE Transactions on Computers (TC), volume 51, issue 5
[Journal Paper]
S.N. Demidenko, N. Lord, A.J. van de Goor, V. Piuri,
Quasi on-line testing of embedded random access memory
(April 2002),
4th International Conference on Massively Parallel Computing Systems (MPCS 2002), 10-12 April 2002, Ischia, Italy
[Conference Paper]
Z. Al-Ars, A.J. van de Goor,
Approximating Infinite Dynamic Behavior for DRAM Cell Defects
(April 2002),
20th IEEE VLSI Test Symposium (VTS 2002), 28 April - 2 May 2002, Monterey, USA
[Conference Paper]
![1121_approximating_infinite_dynamic_behavior_for_dram_cell_defec.pdf](/images/pdf-a.png)
Z. Al-Ars, A.J. van de Goor,
Modeling techniques and tests for partial faults in memory devices
(March 2002),
Design, Automation and Test in Europe Conference and Exposition (DATE 2002), 4-8 March 2002, Paris, France
[Conference Paper]
![1127_modeling_techniques_and_tests_for_partial_faults_in_memory.pdf](/images/pdf-a.png)
A.J. van de Goor, M.S. Abadir, J.F. Carlin,
Minimal test for coupling faults in word-oriented memories
(March 2002),
Design, Automation and Test in Europe Conference and Exposition (DATE 2002), 4-8 March 2002, Paris, France
[Conference Paper]
![1125_minimal_test_for_coupling_faults_in_wordoriented_memories.pdf](/images/pdf-a.png)
S. Hamdioui, A.J. van de Goor,
Thorough Tesing Any Multi-Port Memory with Linear Tests
(February 2002),
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), volume 21, issue 2
[Journal Paper]
S. Hamdioui, Z. Al-Ars, A.J. van de Goor,
Testing static and dynamic faults in random access memories
(January 2002),
20th IEEE VLSI Test Symposium (VTS 2002), 28 April - 2 May 2002, Monterey, USA
[Conference Paper]
![1167_testing_static_and_dynamic_faults_in_random_access_memories.pdf](/images/pdf-a.png)
A.J. van de Goor, I. Schanstra,
Address and data scrambling: causes and impact on memory tests
(January 2002),
1st IEEE International Workshop on Electronic Design, Test and Applications (DELTA 2002), 29-31 January 200, Christchurch, New Zealand
[Conference Paper]
![1162_address_and_data_scrambling_causes_and_impact_on_memory_te.pdf](/images/pdf-a.png)
Z. Al-Ars, A.J. van de Goor, J. Braun, D. Richter,
A memory specific notation for fault modeling
(November 2001),
10th Asian Test Symposium (ATS 2001), 19-21 November 2001, Kyoto, Japan
[Conference Paper]
![1225_a_memory_specific_notation_for_fault_modeling.pdf](/images/pdf-a.png)
S.N. Demidenko, A.J. van de Goor, S. Henderson, P. Knoppers,
Simulation and development of short transparent tests for RAM
(November 2001),
10th Asian Test Symposium (ATS 2001), 19-21 November 2001, Kyoto, Japan
[Conference Paper]
![1223_simulation_and_development_of_short_transparent_tests_for_r.pdf](/images/pdf-a.png)
S. Hamdioui, A.J. van de Goor, D. Eastwick, M. Rodgers,
Detecting unique faults in multi-port SRAMs
(November 2001),
10th Asian Test Symposium (ATS 2001), 19-21 November 2001, Kyoto, Japan
[Conference Paper]
![1217_detecting_unique_faults_in_multiport_srams.pdf](/images/pdf-a.png)
M. Klaus, A.J. van de Goor,
Tests for resistive and capacitive defects in address decoders
(November 2001),
10th Asian Test Symposium (ATS 2001), 19-21 November 2001, Kyoto, Japan
[Conference Paper]
Z. Al-Ars, A.J. van de Goor, J. Braun, D. Richter,
Simulation based analysis of temperature effect on the faulty behaviour of embedded DRAMs
(October 2001),
IEEE International Test Conference (ITC 2001), 30 October - 1 November 2001, Baltimore, USA
[Conference Paper]
![1232_simulation_based_analysis_of_temperature_effect_on_the_faul.pdf](/images/pdf-a.png)
Z. Al-Ars, A.J. van de Goor,
Transient faults in DRAMs: concept, analysis and impact on tests
(August 2001),
9th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2001), 6-7 August 2001, San Jose, USA
[Conference Paper]
![1181_transient_faults_in_drams_concept_analysis_and_impact_on.pdf](/images/pdf-a.png)
S. Hamdioui, A.J. van de Goor, D. Eastwick, M. Rodgers,
Realistic fault models and test procedure for multi-port SRAMs
(August 2001),
9th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2001), 6-7 August 2001, San Jose, USA
[Conference Paper]
![1179_realistic_fault_models_and_test_procedure_for_multiport_sr.pdf](/images/pdf-a.png)
Z. Al-Ars, A.J. van de Goor,
Static and dynamic behavior of memory cell array opens and shorts in embedded DRAMs
(March 2001),
Conference on Design, Automation and Test in Europe (DATE 2001), 12-16 March 2001, Munich, Germany
[Conference Paper]
![1206_static_and_dynamic_behavior_of_memory_cell_array_opens_and.pdf](/images/pdf-a.png)
Z. Al-Ars, A.J. van de Goor, J. Braun, B. Gauch, D. Richter, W. Spirkl,
Development of a DRAM simulation model for fault analysis purposes
(February 2001),
13th Workshop on Testmethods and Reliability of Circuits and Systems, 18–20 February 2001, Miesbach, Germany
[Conference Paper]
![1210_development_of_a_dram_simulation_model_for_fault_analysis_p.pdf](/images/pdf-a.png)
Z. Al-Ars, A.J. van de Goor,
Impact of memory cell array bridges on the faulty behavior in embedded DRAMs
(December 2000),
9th Asian Test Symposium (ATS 2000), 4-6 December 2000, Taipei, Taiwan
[Conference Paper]
![1276_impact_of_memory_cell_array_bridges_on_the_faulty_behavior.pdf](/images/pdf-a.png)
S. Hamdioui, A.J. van de Goor,
An experimental analysis of spot defects in SRAMs: realistic fault models and test
(December 2000),
9th Asian Test Symposium (ATS 2000), 4-6 December 2000, Taipei, Taiwan
[Conference Paper]
![1275_an_experimental_analysis_of_spot_defects_in_srams_realisti.pdf](/images/pdf-a.png)
S. Hamdioui, A.J. van de Goor,
Testing address decoder faults in two-port memories: fault models, test, consequences of port restrictions, and test strategy
(October 2000),
Journal of Electronic Testing: Theory and Applications (JETTA), volume 16, issue 5
[Journal Paper]
![1286_testing_address_decoder_faults_in_twoport_memories_fault.pdf](/images/pdf-a.png)
A.J. van de Goor, A. Paalvast,
Industrial Evaluation of DRAM SIMM Tests
(October 2000),
IEEE International Test Conference (ITC 2000), 3-5 October 2000, Atlantic City, USA
, Top Ten Best Papers Awards
[Conference Paper]
![1279_industrial_evaluation_of_dram_simm_tests.pdf](/images/pdf-a.png)
M.J. Geuzebroek, J. van der Linden, A.J. van de Goor,
Test Point Insertion for Compact Test Sets
(October 2000),
IEEE International Test Conference (ITC 2000), 3-5 October 2000, Atlantic City, USA
[Conference Paper]
S. Hamdioui, A.J. van de Goor, M. Rodgers, D. Eastwick,
March tests for realistic faults in two-port memories
(August 2000),
8th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2000), 7-8 August 2000, San Jose, USA
[Conference Paper]
![1249_march_tests_for_realistic_faults_in_twoport_memories.pdf](/images/pdf-a.png)
A.J. van de Goor, Z. Al-Ars,
Functional memory faults: a formal notation and a taxonomy
(April 2000),
18th IEEE VLSI Test Symposium (VTS 2000), 30 April - 4 May 2000, Montreal, Canada
[Conference Paper]
![1264_functional_memory_faults_a_formal_notation_and_a_taxonomy.pdf](/images/pdf-a.png)