Home » Authors » V. van der Leest

V. van der Leest

NameV. van der Leest
First Name
E-mailVincent.van.der.Leest@intrinsic-id.com
Author TypeExternal
AffiliationIntrinsic-ID

Publications

A.M.M.O. Cortez, S. Hamdioui, A. Kaichouhi, V. van der Leest, R. Maes, G.J. Schrijen, Intelligent Voltage Ramp-up Time Adaptation for Temperature Noise Reduction on Memory-based PUF Systems 1474_intelligent_voltage_rampup_time_adaptation_for_temperature.pdf (April 2015), IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), volume 34, issue 7 , DOI: 10.1109/TCAD.2015.2422844 [Journal Paper]
A.M.M.O. Cortez, V. van der Leest, R. Maes, G.J. Schrijen, S. Hamdioui, Adapting Voltage Ramp-up Time for Temperature Noise Reduction on Memory-based PUFs 1345_adapting_voltage_rampup_time_for_temperature_noise_reducti.pdf (June 2013), IEEE International Symposium on Hardware-Oriented Security and Trust (HOST 2013), 2-3 June 2013, Austin, USA [Conference Paper]
A.M.M.O. Cortez, S. Hamdioui, V. van der Leest, R. Maes, G.J. Schrijen, Noise Reduction on Memory-based PUFs 1396_noise_reduction_on_memorybased_pufs.pdf (March 2013), 1st Workshop on Trustworthy Manufacturing and Utilization of Secure Devices (TRUDEVICE 2013), 30-31 May 2013, Avignon, France [Conference Paper]
A.M.M.O. Cortez, V. van der Leest, G.J. Schrijen, S. Hamdioui, Investigation of Voltage Ramp-up Time for Temperature Noise Reduction on Memory-based PUFs (October 2012), ICT.OPEN 2012 (ICT.OPEN 2012), 22-23 October 2012, Rotterdam, The Netherlands [Conference Paper]