A.M.M.O. Cortez, Reliability Assessment and Test Methods for Anti-counterfeiting Technology (November 2015), [Phd Thesis]

A.M.M.O. Cortez, S. Hamdioui, A. Kaichouhi, V. van der Leest, R. Maes, G.J. Schrijen, Intelligent Voltage Ramp-up Time Adaptation for Temperature Noise Reduction on Memory-based PUF Systems (April 2015), IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), volume 34, issue 7 , DOI: 10.1109/TCAD.2015.2422844 [Journal Paper]

A.M.M.O. Cortez, S. Hamdioui, G. Di Natale, M.-L. Flottes, B. Rouzeyre, Hierarchical Secure DfT (March 2015), Workshop on Trustworthy Manufacturing and Utilization of Secure Devices (TRUDEVICE 2015), 13 March 2015, Grenoble, France [Conference Paper]

A.M.M.O. Cortez, S. Hamdioui, R. Ishihara, Design Dependent SRAM PUF Robustness Analysis (March 2015), 16th IEEE Latin-American Test Symposium (LATS 2015), 25-27 March 2015, Puerto Vallarta, Mexico , DOI: 10.1109/LATW.2015.7102498 [Conference Paper]

A.M.M.O. Cortez, G. Roelofs, S. Hamdioui, G. Di Natale, Testing Methods for PUF-Based Secure Key Storage Circuits (October 2014), Journal of Electronic Testing: Theory and Applications (JETTA), volume 30, issue 5 , Digital Object Identifier (DOI): 10.1007/s10836-014-5471-7 [Journal Paper]

A.M.M.O. Cortez, G. Roelofs, S. Hamdioui, G. Di Natale, Secure Test Method for Fuzzy Extractor (September 2014), Joint MEDIAN–TRUDEVICE Open Forum, 30 September 2014, Amsterdam, The Netherlands [Conference Paper]

A.M.M.O. Cortez, G. Roelofs, S. Hamdioui, G. Di Natale, Testing PUF-based Secure Key Storage Circuits (March 2014), Design, Automation & Test in Europe (DATE 2014), 24-28 March 2014, Dresden, Germany [Conference Paper]

A.M.M.O. Cortez, V. van der Leest, R. Maes, G.J. Schrijen, S. Hamdioui, Adapting Voltage Ramp-up Time for Temperature Noise Reduction on Memory-based PUFs (June 2013), IEEE International Symposium on Hardware-Oriented Security and Trust (HOST 2013), 2-3 June 2013, Austin, USA [Conference Paper]

A.M.M.O. Cortez, S. Hamdioui, V. van der Leest, R. Maes, G.J. Schrijen, Noise Reduction on Memory-based PUFs (March 2013), 1st Workshop on Trustworthy Manufacturing and Utilization of Secure Devices (TRUDEVICE 2013), 30-31 May 2013, Avignon, France [Conference Paper]

A.M.M.O. Cortez, V. van der Leest, G.J. Schrijen, S. Hamdioui, Investigation of Voltage Ramp-up Time for Temperature Noise Reduction on Memory-based PUFs (October 2012), ICT.OPEN 2012 (ICT.OPEN 2012), 22-23 October 2012, Rotterdam, The Netherlands [Conference Paper]

A.M.M.O. Cortez, A. Dargar, G.J. Schrijen, S. Hamdioui, Modeling SRAM Start-Up Behavior for Physical Unclonable Functions (October 2012), IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2012), 3-5 October 2012, Austin, USA , Best Student Paper Award [Conference Paper]