A. Zarei

NameA. Zarei
First Name
E-mail
Author TypeExternal
Affiliation

Publications

M. Zandrahimi, H.R. Zarandi, A. Zarei, A Probabilistic Method to Detect Anomalies in Embedded Systems (October 2010), 25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT 2010), 6-8 October 2010, Kyoto, Japan [Conference Paper]