M. Zandrahimi

NameM. Zandrahimi
First NameMahroo
E-mail
Author TypePhd Student
AffiliationTU Delft

Publications

M. Zandrahimi, P. Debaud, A. Castillejo, Z. Al-Ars, Transition Fault Testing for Offline Adaptive Voltage Scaling (to appear: October 2017), International Test Conference (ITC 2017), 31 October - 2 November 2017, Fort Worth, USA [Conference Proceedings]
M. Zandrahimi, P. Debaud, A. Castillejo, Z. Al-Ars, Using Transition Fault Test Patterns for Cost Effective Offline Performance Estimation (April 2017), 12th International Conference on Design &Technology of Integrated Systems in Nanoscale Era (DTIS 2017), 4-6 April 2017, Palma de Mallorca, Spain [Conference Paper]
M. Zandrahimi, A. Castillejo, P. Debaud, Z. Al-Ars, Industrial Approaches for Performance Evaluation Using On-Chip Monitors 1561_industrial_approaches_for_performance_evaluation_using_onc.pdf (December 2016), 11th IEEE International Design & Test Symposium (IDT 2016), 18-20 December 2016, Hammamet, Tunisia [Conference Paper]
M. Zandrahimi, Z. Al-Ars, P. Debaud, A. Castillejo, Challenges of Using On-Chip Performance Monitors for Process and Environmental Variation Compensation (March 2016), Design, Automation and Test in Europe (DATE 2016), 14-18 March 2016, Dresden, Germany [Conference Proceedings]
M. Zandrahimi, Z. Al-Ars, A Survey on Low-Power Techniques for Single and Multicore Systems 1449_a_survey_on_lowpower_techniques_for_single_and_multicore_s.pdf (October 2014), 3rd International Conference on Context-Aware Systems and Applications (ICCASA 2014), 15-16 October 2014, Dubai, United Arab Emirates [Conference Paper]
M. Zandrahimi, Z. Al-Ars, An Overview of Power Reduction Techniques for Single and Multicore Systems 1433_an_overview_of_power_reduction_techniques_for_single_and_mu.pdf (November 2013), ICT.OPEN 2013, 27-28 November 2013, Eindhoven, The Netherlands [Conference Paper]
M. Zandrahimi, H.R. Zarandi, M. H. Mottaghi, Two Effective Methods to Detect Anomalies in Embedded Systems (January 2012), Microelectronics Journal, volume 43, issue 1 [Journal Paper]
M. Zandrahimi, H.R. Zarandi, A. Zarei, A Probabilistic Method to Detect Anomalies in Embedded Systems (October 2010), 25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT 2010), 6-8 October 2010, Kyoto, Japan [Conference Paper]