Computer Engineering Publications Database (2000-2018) G. Cardoso Medeiros
| Name | G. Cardoso Medeiros |
|---|---|
| First Name | Guilherme |
| G.CardosoMedeiros@tudelft.nl | |
| Author Type | Phd Student |
| Affiliation |
Publications
G. Cardoso Medeiros, L. M. Bolzani Poehls, M. Taouil, F. Luis Vargas, S. Hamdioui,
A Defect-Oriented Test Approach Using On-Chip Current Sensors for Resistive Defects in FinFET SRAMs
(September 2018),
Microelectronics Reliability, volume 88-90
[Journal Paper]