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P. Ren

NameP. Ren
First NamePengwei
E-mail
Author TypeMsc Student
AffiliationASML

Publications

A.J. van den Berg, P. Ren, E.J. Marinissen, G.N. Gaydadjiev, K.G.W. Goossens, Bandwidth Analysis of Functional Interconnects Used as Test Access Mechanism 164_bandwidth_analysis_of_functional_interconnects_used_as_test.pdf (July 2010), Journal of Electronic Testing: Theory and Applications (JETTA), volume 26, issue 4 [Journal Paper]
P. Ren, Wrapper design for the reuse of a NoC or other functional interconnect as test infrastructure 772_wrapper_design_for_the_reuse_of_a_noc_or_other_functional_in.pdf (December 2006), [Msc Thesis]