S.K. Goel
Name | S.K. Goel |
---|---|
First Name | Sandeep |
Author Type | External |
Affiliation |
Publications
B. Noia, S.K. Goel, K. Chakrabarty, E.J. Marinissen, J. Verbree,
Test-architecture optimization for TSV-based 3D stacked ICs
(May 2010),
15th IEEE European Test Symposium (ETS 2010), 25-28 May 2010, Prague, Czech Republic
[Conference Paper]