S.K. Goel

NameS.K. Goel
First NameSandeep
E-mail
Author TypeExternal
Affiliation

Publications

B. Noia, S.K. Goel, K. Chakrabarty, E.J. Marinissen, J. Verbree, Test-architecture optimization for TSV-based 3D stacked ICs (May 2010), 15th IEEE European Test Symposium (ETS 2010), 25-28 May 2010, Prague, Czech Republic [Conference Paper]