J. van der Linden

NameJ. van der Linden
First NameHans
E-mail
Author TypeExternal
AffiliationTU Delft

Publications

M.J. Geuzebroek, J. van der Linden, A.J. van de Goor, Test point insertion that facilitates ATPG in reducing test time and data volume 1157_test_point_insertion_that_facilitates_atpg_in_reducing_test.pdf (October 2002), IEEE International Test Conference (ITC 2002), 7-10 October 2002, Baltimore, USA [Conference Paper]
M.J. Geuzebroek, J. van der Linden, A.J. van de Goor, Test Point Insertion for Compact Test Sets (October 2000), IEEE International Test Conference (ITC 2000), 3-5 October 2000, Atlantic City, USA [Conference Paper]