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M.J. Geuzebroek

NameM.J. Geuzebroek
First NameJeroen
E-mail
Author TypePhd Student
AffiliationTU Delft

Publications

M.J. Geuzebroek, A.J. van de Goor, TPI for improving PR Fault Coverage of Boolean and Three-State Circuits 1034_tpi_for_improving_pr_fault_coverage_of_boolean_and_threest.pdf (May 2003), 8th IEEE European Test Workshop (ETW 2003), 25-28 May 2003, Maastricht, The Netherlands [Conference Paper]
M.J. Geuzebroek, Test Point Insertion to improve BIST performance, and to reduce ATPG test time and data volume 1032_test_point_insertion_to_improve_bist_performance_and_to_re.pdf (May 2003), [Phd Thesis]
M.J. Geuzebroek, J. van der Linden, A.J. van de Goor, Test point insertion that facilitates ATPG in reducing test time and data volume 1157_test_point_insertion_that_facilitates_atpg_in_reducing_test.pdf (October 2002), IEEE International Test Conference (ITC 2002), 7-10 October 2002, Baltimore, USA [Conference Paper]
C. Feige, M.J. Geuzebroek, Logic BIST Technology Evaluation: an Industrial Case Study (May 2001), IEEE European Test Workshop (ETW 2001), 29 May - 1 June 2001, Stockholm, Sweden [Conference Paper]
M.J. Geuzebroek, J. van der Linden, A.J. van de Goor, Test Point Insertion for Compact Test Sets (October 2000), IEEE International Test Conference (ITC 2000), 3-5 October 2000, Atlantic City, USA [Conference Paper]