M.J. Geuzebroek
Name | M.J. Geuzebroek |
---|---|
First Name | Jeroen |
Author Type | Phd Student |
Affiliation | TU Delft |
Publications
M.J. Geuzebroek, A.J. van de Goor,
TPI for improving PR Fault Coverage of Boolean and Three-State Circuits
(May 2003),
8th IEEE European Test Workshop (ETW 2003), 25-28 May 2003, Maastricht, The Netherlands
[Conference Paper]
![1034_tpi_for_improving_pr_fault_coverage_of_boolean_and_threest.pdf](/images/pdf-a.png)
M.J. Geuzebroek,
Test Point Insertion to improve BIST performance, and to reduce ATPG test time and data volume
(May 2003),
[Phd Thesis]
![1032_test_point_insertion_to_improve_bist_performance_and_to_re.pdf](/images/pdf-a.png)
M.J. Geuzebroek, J. van der Linden, A.J. van de Goor,
Test point insertion that facilitates ATPG in reducing test time and data volume
(October 2002),
IEEE International Test Conference (ITC 2002), 7-10 October 2002, Baltimore, USA
[Conference Paper]
![1157_test_point_insertion_that_facilitates_atpg_in_reducing_test.pdf](/images/pdf-a.png)
C. Feige, M.J. Geuzebroek,
Logic BIST Technology Evaluation: an Industrial Case Study
(May 2001),
IEEE European Test Workshop (ETW 2001), 29 May - 1 June 2001, Stockholm, Sweden
[Conference Paper]
M.J. Geuzebroek, J. van der Linden, A.J. van de Goor,
Test Point Insertion for Compact Test Sets
(October 2000),
IEEE International Test Conference (ITC 2000), 3-5 October 2000, Atlantic City, USA
[Conference Paper]