A. Paalvast
Name | A. Paalvast |
---|---|
First Name | Alex |
Author Type | External |
Affiliation | TU Delft |
Publications
A.J. van de Goor, A. Paalvast,
Industrial Evaluation of DRAM SIMM Tests
(October 2000),
IEEE International Test Conference (ITC 2000), 3-5 October 2000, Atlantic City, USA
, Top Ten Best Papers Awards
[Conference Paper]