A. Paalvast

NameA. Paalvast
First NameAlex
E-mail
Author TypeExternal
AffiliationTU Delft

Publications

A.J. van de Goor, A. Paalvast, Industrial Evaluation of DRAM SIMM Tests 1279_industrial_evaluation_of_dram_simm_tests.pdf (October 2000), IEEE International Test Conference (ITC 2000), 3-5 October 2000, Atlantic City, USA , Top Ten Best Papers Awards [Conference Paper]