M. Rovatti

NameM. Rovatti
First Name
E-mail
Author TypeExternal
Affiliation

Publications

M.C.R. Fieback, M. Taouil, S. Hamdioui, M. Rovatti, Ionizing radiation modeling in DRAM transistors (March 2018), IEEE 19th Latin-American Test Symposium (LATS 2018), 12-16 March 2018, Sao Paulo, Brazil , Best paper award! [Conference Paper]