Computer Engineering Publications Database (2000-2018) M.C.R. Fieback
| Name | M.C.R. Fieback |
|---|---|
| First Name | Moritz |
| m.c.r.fieback@tudelft.nl | |
| Author Type | Phd Student |
| Affiliation |
Publications
M.C.R. Fieback, M. Taouil, S. Hamdioui, M. Rovatti,
Ionizing radiation modeling in DRAM transistors
(March 2018),
IEEE 19th Latin-American Test Symposium (LATS 2018), 12-16 March 2018, Sao Paulo, Brazil
, Best paper award!
[Conference Paper]
M.C.R. Fieback,
DRAM Reliability: Aging Analysis and Reliability Prediction Model
(December 2017),
[Msc Thesis]