A Raychowdhur

NameA Raychowdhur
First NameArijit
E-mail
Author TypeExternal
Affiliation

Publications

S. Hamdioui, P. Pouyan, H Li, Y. Wang, A Raychowdhur, I Yoon, Test and Reliability of Emerging Non-Volatile Memories (to appear: November 2017), 26th IEEE Asian Test Symposium (ATS 2017), 27-30 November 2017, Taipei, Taiwan [Conference Proceedings]