P. Pouyan

NameP. Pouyan
First NamePeyman
Author TypePostDoc


E. I. Vatajelu, P. Pouyan, S. Hamdioui, State of the Art and Challenges for Test and Reliability of Emerging Non-volatile Resistive Memories (November 2017), International Journal of Circuit Theory and Applications [Journal Paper]
S. Hamdioui, P. Pouyan, H Li, Y. Wang, A Raychowdhur, I Yoon, Test and Reliability of Emerging Non-Volatile Memories (November 2017), 26th IEEE Asian Test Symposium (ATS 2017), 27-30 November 2017, Taipei, Taiwan [Conference Proceedings]
M. Escudero Martinez, A. Rubio, P. Pouyan, Reliability issues in RRAM ternary memories affected by variability and aging mechanisms (July 2017), 23rd IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS 2017), 3-5 July 2017, Thessaloniki, Greece [Conference Proceedings]
C Sgouropoulou, I Voyiatzis, A Koutoumanos, S. Hamdioui, P. Pouyan, M Comte, P Prinetto, G Farulla, C Delgado Kloos, R Crespo Garcia, Standards-based tools and services for building lifelong learning pathways (May 2017), IEEE Global Engineering Education Conference (EDUCON 2017), 25-28 April 2017, Athens, Greece [Conference Proceedings]
P. Pouyan, E. Amat, A. Rubio, S. Hamdioui, Resistive Random Access Memory Variability and Its Mitigation Schemes (February 2017), Journal of Low Power Electronics (JOLPE), volume 13, issue 1 [Journal Paper]
M. Escudero Martinez, E. Amat, A. Rubio, P. Pouyan, An experience with Chalcogenide memristors, and implications on memory and computer applications (November 2016), Conference on Design of Circuits and Integrated Systems (DCIS 2016), 23-25 November 2016, Granada, Spain [Conference Proceedings]
P. Pouyan, E. Amat, S. Hamdioui, A. Rubio, RRAM Variability and Its Mitigation Schemes 1569_rram_variability_and_its_mitigation_schemes.pdf (September 2016), PATMOS & VARI 2016 (PATMOS & VARI 2016), 21-23 September 2016, Bremen, Germany , Best Paper Award [Conference Proceedings]