Computer Engineering Publications Database (2000-2018) I Yoon
| Name | I Yoon |
|---|---|
| First Name | Insik |
| Author Type | External |
| Affiliation |
Publications
S. Hamdioui, P. Pouyan, H Li, Y. Wang, A Raychowdhur, I Yoon,
Test and Reliability of Emerging Non-Volatile Memories
(November 2017),
26th IEEE Asian Test Symposium (ATS 2017), 27-30 November 2017, Taipei, Taiwan
[Conference Proceedings]