Y. Wang

NameY. Wang
First NameYao
E-mailYao.Wang@tudelft.nl
Author TypePhd Student
AffiliationTU Delft

Publications

S. Hamdioui, P. Pouyan, H Li, Y. Wang, A Raychowdhur, I Yoon, Test and Reliability of Emerging Non-Volatile Memories (to appear: November 2017), 26th IEEE Asian Test Symposium (ATS 2017), 27-30 November 2017, Taipei, Taiwan [Conference Proceedings]
Y. Wang, S.D. Cotofana, L. Fang, Lifetime Reliability Assessment with Aging Information from Low-Level Sensors 1591_lifetime_reliability_assessment_with_aging_information_from.pdf (May 2013), Great Lakes Symposium on VLSI (GLSVLSI 2013 ), 2-3 May 2013, Paris, France [Conference Paper]
Y. Wang, M. Enachescu, S.D. Cotofana, L. Fang, Variation tolerant on-chip degradation sensors for dynamic reliability management systems 1310_variation_tolerant_onchip_degradation_sensors_for_dynamic.pdf (September 2012), Microelectronics Reliability, volume 52, issue 9-10 [Journal Paper]
Y. Wang, S.D. Cotofana, L. Fang, Statistical Reliability Analysis of NBTI Impact on FinFET SRAMs and Mitigation Technique Using Independent-Gate Devices 1294_statistical_reliability_analysis_of_nbti_impact_on_finfet_s.pdf (July 2012), IEEE/ACM International Symposium on Nanoscale Architectures (NANOARCH 2012), 4-6 July 2012, Amsterdam, The Netherlands [Conference Paper]
Y. Wang, S.D. Cotofana, A Unified Aging Model of NBTI and HCI Degradation towards Lifetime Reliability Management for Nanoscale MOSFET Circuits 52_a_unied_aging_model_of_nbti_and_hci_degradation_towards_li.pdf (June 2011), IEEE/ACM International Symposium on Nanoscale Architectures (NANOARCH 2011), 8-9 June 2011, San Diego, USA [Conference Paper]
Y. Wang, S.D. Cotofana, A Novel Virtual Age Reliability Model for Time-toFailure Prediction 264_a_novel_virtual_age_reliability_model_for_timetofailure_pre.pdf (October 2010), IEEE International Integrated Reliability Workshop Final Report (IRW 2010), 17-21 October 2010, South Lake Tahoe, USA [Conference Paper]