S. Hamdioui, P. Pouyan, H Li, Y. Wang, A Raychowdhur, I Yoon, Test and Reliability of Emerging Non-Volatile Memories (November 2017), 26th IEEE Asian Test Symposium (ATS 2017), 27-30 November 2017, Taipei, Taiwan [Conference Proceedings]

Y. Wang, S.D. Cotofana, L. Fang, Analysis of the Impact of Spatial and Temporal Variation on the Stability of SRAM Arrays and Mitigation Technique Using Independent-Gate Devices (June 2014), Journal of Parallel and Distributed Computing, volume 74, issue 6 [Journal Paper]

Y. Wang, Aging Assessment and Reliability Aware Computing Platforms (September 2013), [Phd Thesis]

Y. Wang, S.D. Cotofana, L. Fang, Lifetime Reliability Assessment with Aging Information from Low-Level Sensors (May 2013), Great Lakes Symposium on VLSI (GLSVLSI 2013 ), 2-3 May 2013, Paris, France [Conference Paper]

Y. Wang, M. Enachescu, S.D. Cotofana, L. Fang, Variation tolerant on-chip degradation sensors for dynamic reliability management systems (September 2012), Microelectronics Reliability, volume 52, issue 9-10 [Journal Paper]

Y. Wang, S.D. Cotofana, L. Fang, Statistical Reliability Analysis of NBTI Impact on FinFET SRAMs and Mitigation Technique Using Independent-Gate Devices (July 2012), IEEE/ACM International Symposium on Nanoscale Architectures (NANOARCH 2012), 4-6 July 2012, Amsterdam, The Netherlands [Conference Paper]

Y. Wang, S.D. Cotofana, A Unified Aging Model of NBTI and HCI Degradation towards Lifetime Reliability Management for Nanoscale MOSFET Circuits (June 2011), IEEE/ACM International Symposium on Nanoscale Architectures (NANOARCH 2011), 8-9 June 2011, San Diego, USA [Conference Paper]

Y. Wang, S.D. Cotofana, A Novel Virtual Age Reliability Model for Time-toFailure Prediction (October 2010), IEEE International Integrated Reliability Workshop Final Report (IRW 2010), 17-21 October 2010, South Lake Tahoe, USA [Conference Paper]