A.M.M.O. Cortez, G. Roelofs, S. Hamdioui, G. Di Natale, Testing Methods for PUF-Based Secure Key Storage Circuits (October 2014), Journal of Electronic Testing: Theory and Applications (JETTA), volume 30, issue 5 , Digital Object Identifier (DOI): 10.1007/s10836-014-5471-7 [Journal Paper]

A.M.M.O. Cortez, G. Roelofs, S. Hamdioui, G. Di Natale, Secure Test Method for Fuzzy Extractor (September 2014), Joint MEDIAN–TRUDEVICE Open Forum, 30 September 2014, Amsterdam, The Netherlands [Conference Paper]

A.M.M.O. Cortez, G. Roelofs, S. Hamdioui, G. Di Natale, Testing PUF-based Secure Key Storage Circuits (March 2014), Design, Automation & Test in Europe (DATE 2014), 24-28 March 2014, Dresden, Germany [Conference Paper]

G. Roelofs, Design for Testability for Secure ICs (October 2013), [Msc Thesis]